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Reports on the use of specular x-ray reflectivity to probe the structures of self-assembled monolayers and multilayers deposited using a three-step siloxane self-assembly technique that is repeated to form periodic multilayers. Increase in the film thickness as a function of the number of trilayers; Bragg peaks corresponding to the inter-trilayer spacing.

Specular x-ray reflectivity has been used to probe the microstructures of siloxane-based self-assembled electro-optic superlattices composed of high-hyperpolarizable organic chromophore arrays intercalated with Ga and In oxide sheets. The film thickness increases linearly as a function of the number of layers, underscoring the high structural regularity and efficiency of the synthetic approach. Relatively dense metal oxide structures are detected in these systems. The x-ray reflectivity data also indicate that the dependence of the relative surface roughness on the number of layers is nearly identical for self-assembled organic and organic–inorganic hybrid film structures. © 2001 American Institute of Physics. [ABSTRACT FROM AUTHOR]