1. Raman Imaging of Silicon Structures.
- Author
-
Tuschel, David
- Subjects
- *
RAMAN spectroscopy , *MICROELECTROMECHANICAL systems , *IMAGING systems in chemistry , *ION implantation , *THIN film devices , *SEMICONDUCTORS , *SILICON - Abstract
The article discusses the Raman spectroscopy (RS) for imaging of silicon structures to characterize thin film and ion implanted silicon structures. The RS find applications in electronics like microelectromechanical systems (MEMS). The article further discusses the usefulness of imaging in revealing spatial heterogeneity of solid state structures where substrates are silicon, silicon dioxide, polycrystalline silicon and ion-implanted silicon.
- Published
- 2013