Search

Your search keyword '"Tuominen, Marko"' showing total 42 results

Search Constraints

Start Over You searched for: Author "Tuominen, Marko" Remove constraint Author: "Tuominen, Marko" Publication Year Range Last 50 years Remove constraint Publication Year Range: Last 50 years
42 results on '"Tuominen, Marko"'

Search Results

1. Nano-analytical investigation of the forming process in an HfO2-based resistive switching memory.

3. Thermal Atomic Layer Etching of Aluminum Oxide (Al2O3) Using Sequential Exposures of Niobium Pentafluoride (NbF5) and Carbon Tetrachloride (CCl4)

9. Combining Experimental and DFT Investigation of the Mechanism Involved in Thermal Etching of Titanium Nitride Using Alternate Exposures of NbF5 and CCl4, or CCl4 Only.

11. Component interfaces in action-based programming language

14. Tribological properties of thin films made by atomic layer deposition sliding against silicon

15. Island growth in the atomic layer deposition of zirconium oxide and aluminum oxide on hydrogen-terminated silicon: Growth mode modeling and transmission electron microscopy.

16. Diffusion barrier material for Cu metallization using ALD-[WN.sub.x][C.sub.y]. (Deposition)

18. Titanium nitride by atomic layer deposition:mechanical properties

20. Tribological properties of thin films made by atomic layer deposition sliding against silicon.

21. TiF3:TiN nanocomposite thin films - a novel transparent conductor system.

22. Moninpelattava taktinen roolipeli Java-palvelimella ja Android-asiakkaalla

34. High Growth Rate SiO2 by Atomic Layer Deposition

35. Scale-up of the BaTiO3 ALD Process onto 200 mm Wafer

36. Initial Stage of the Ultrathin Oxide Growth in Water Vapor on Si?(?100?)? Surface

37. Diffusion barrier material for Cu metallization using ALD-WN[subx]C[suby].

38. Atomic-layer-deposited WN[sub x]C[sub y] thin films as diffusion barrier for copper metallization.

39. Electrical and materials properties of ZrO[sub 2] gate dielectrics grown by atomic layer chemical vapor deposition.

40. Scale-up of the BaTiO3ALD Process onto 200 mm Wafer

41. Thermal Atomic Level Etching of Al2O3, HfO2, TiN and SiGe

Catalog

Books, media, physical & digital resources