17 results on '"Bleichner, H."'
Search Results
2. A comparative study of the carrier distributions in dynamically operating GTO's by means of two optically probed measurement methods.
3. Cosmic ray-induced DC-stability failure in Si diodes.
4. The influence of gate-metallization potential drop on transient GTO characteristics.
5. Experimentally verified, temperature dependent physical models/parameters for power device simulation.
6. On P-I-N Diode Parameters and Static Properties at Elevated Temperatures and High Current Densities-Experiment vs. Simulation.
7. A study of design influence on anode-shorted GTO thyristor turn-on and turn-off.
8. The effect of emitter shortings on turn-off limitations and device failure in GTO thyristors under snubberless operation.
9. Measurements of failure phenomena in inductively loaded multi-cathode GTO thyristors.
10. A time-dependent two-dimensional analysis of the turn-off process in a gate turn-off thyristor (GTO).
11. An optical system for bilateral recombination-radiation diagnostics of the carrier redistribution in switching power devices.
12. A time-resolved optical system for spatial characterization of the carrier distribution in a gate turn-off thyristor (GTO).
13. 2-D characterization of dynamic charge distribution in MOS controlled thyristors: experiment and simulation.
14. Turn-off failure mechanisms in gto thyristors of different anode designs supported by 3-d simulations
15. A comparative study of the carrier distributions in dynamically operating GTO's by means of two optically probed measurement methods
16. Cosmic ray-induced DC-stability failure in Si diodes
17. Turn-off failure mechanisms in gto thyristors of different anode designs supported by 3-d simulations.
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.