22 results on '"Sheridan, David"'
Search Results
2. Investigation of Gate Leakage Current Behavior for Commercial 1.2 kV 4H-SiC Power MOSFETs
3. Special Issue on Reliability.
4. Experimental study of 650V AlGaN/GaN HEMT short-circuit safe operating area (SCSOA)
5. A Coverage Guided Mining Approach for Automatic Generation of Succinct Assertions
6. Reverse conduction properties of vertical SiC trench JFETs
7. Signature Pattern Covering via Local Greedy Algorithm and Pattern Shrink
8. Automatic generation of assertions from system level design using data mining
9. GoldMine: Automatic assertion generation using data mining and static analysis
10. Improved two-stage DC-coupled gate driver for enhancement-mode SiC JFET
11. Characterization and Modeling of Intermodulation Linearity in a 200 GHz SiGe HBT Technology
12. p-i-n Diodes for Monolithic Millimeter Wave BiCMOS Applications
13. Test methods, test techniques and failure criteria for evaluation of ESD degradation of analog and radio frequency (RF) technology.
14. Mining Hardware Assertions With Guidance From Static Analysis.
15. Parameter Extraction Procedure for Vertical SiC Power JFET.
16. Model for Power SiC Vertical JFET With Unified Description of Linear and Saturation Operating Regimes.
17. A Physics-Based Model for a SiC JFET Accounting for Electric-Field-Dependent Mobility.
18. Frequency and Bias-Dependent Modeling of Correlated Base and Collector Current RF Noise in SiGe HBTs Using Quasi-Static Equivalent Circuit.
19. Proton Radiation Effects in 4H-SiC Diodes and MOS Capacitors.
20. Silicon-Germanium BiCMOS HBT Technology for Wireless Power Amplifier Applications.
21. Impact of Proton Irradiation on the Static and Dynamic Characteristics of High-Voltage 4H-SiC JBS Switching Diodes.
22. The Effects of High-Dose Gamma Irradiation on High-Voltage 4H-SiC Schottky Diodes and the SiC-SiO[sub2] Interface.
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.