106 results on '"Danto, Yves"'
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2. Reliability of Laser Diodes for High-rate Optical Communications – A Monte Carlo-based Method to Predict Lifetime Distributions and Failure Rates in Operating Conditions
3. Reliability Simulation of Electronic Circuits with VHDL-AMS
4. 3 - Reliability of Laser Diodes for High-rate Optical Communications – A Monte Carlo-based Method to Predict Lifetime Distributions and Failure Rates in Operating Conditions
5. Challenges and potential of new approaches for reliability assessment of nanotechnologies
6. International Flipped Class for Chinese Honors Bachelor Students in the Frame of Multidisciplinary Fields: Reliability and Microelectronics
7. Dynamic void formation in a DD-copper-structure with different metallization geometry
8. An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy
9. Apport de l’analyse technologique à l’enseignement de la microélectronique
10. Simulation of time depending void formation in copper, aluminum and tungsten plugged via structures
11. 1/f noise as a diagnostic tool to investigate the quality of isotropic conductive adhesive bonds
12. International pedagogic approach for Chinese Honors Bachelor students: awareness to innovation in the field of electrical and information engineering
13. Life time prediction of BGA assemblies with experimental torsion test and finite element analysis
14. Prédiction de distributions de durées de vie de composants optoélectroniques émissifs 1.55 µm : Lois expérimentales et méthodologie statistique
15. Evaluation of SRAMs reliability for space electronics using ultrashort laser pulses
16. CEM et Fiabilité des Systèmes Electroniques Embarqués. Projet étudiant pour la mesure de la susceptibilité électromagnétique d'un circuit intégré
17. La simulation de l'usure des circuits intégrés analogique : prise en compte de l'interaction fonction, profil de misssion, circuit
18. Multi-level Modeling of hot carrier injection for reliability simulation using VHDL-AMS
19. Long-term reliability prediction of 935 nm InGaAs/GaAs Light Emitting Diodes using degradation laws and ageing tests with low acceleration factor
20. First steps toward ageing simulation of complex analogue circuits with behaioural modelling
21. Scanning laser ultrasonics experiments for in-situ non-destructive analysis of integrated circuits
22. Analyse de la fiabilité de filières technologiques de diodes électroluminescentes pour des applications spatiales : synthèse bibliographique (technologies AlGaAs/GaAs, AlGaInP/GaP, InGaN/GaN): Rapport de contrat pour le CNES - Marché CNES N°03/CNES/1445-DPI500
23. Analyse de la fiabilité de filières technologiques de diodes électroluminescentes pour des applications spatiales : synthèse bibliographique (technologies AlGaAs/GaAs, AlGaInP/GaP, InGaN/GaN)
24. Estimation of lifetime distributions on 1550 nm DFB laser diodes using Monte-Carlo statistic computations
25. Reliability of Low-Cost PCB Interconnections for Telecommunication Applications
26. Evaluation of SRAMs Reliability for Space Electronics Using Ultra Short Laser Pulses
27. Simulations of thermomechanical stresses and optical misalignment in 1.55 µm emissive optoelectronic modules using FEM and process dispersions
28. Study of influence of failure modes on lifetime distribution prediction of 1.55 µm DFB laser diodes using weak drift of monitored parameters during ageing tests
29. Modélisation comportementale de la fiabilité des circuits intégrés complexes
30. Reliability Simulation of Electronic Circuits with VHDL-AMS
31. Modélisation comportementale et fiabilité des systèmes
32. Early failure signatures after thermal cycles of 1310 nm Laser modules using electrical, optical and spectral measurements
33. Impedance spectroscopy on aluminium and tantalum capacitors after more than 10 years in uses at EDF
34. Application of Picosecond Ultrasonics to Non-Destructive Defect Analysis in VLSI Circuits
35. Modèle Comportemental VHDL-AMS d'un Amplificateur CMOS à Transconductance: Application à la conception de filtres
36. Prévision de l'impact du vieillissement des composants sur le comportement des circuits
37. Impact of 1.55 µm laser diode degradation laws on fibre optic system performances using a system simulator
38. Three-Dimensional FEM Simulations of Thermomechanical Stresses in 1.55 µm Laser modules
39. Reliability Analysis of Tantalum Capacitors for High Temperature Application
40. RETWINE : A Experience in Teleinstrumentation by the web
41. Les travaux pratiques à distance
42. Reliability evaluation of GaAs HBT technologies
43. Investigation on GaAs power MESFETs submitted to RF life-test by LF noise and drain current transient analysis
44. Analysis of Two Degradation Mechanisms in GaInP/GaAs Fully Planar HBT Technology
45. Caractérisation d interfaces Cu/Al2O3 par un système d analyse ultrasonore
46. A distributed environment in Microelectronics Instrumentation Learning
47. A new Approach of continuing Education for Engineer : advanced Instruments Training in a telematic Network
48. MLCC Type II tested by resonant sound
49. Industrial use of conductive adhesives for SMT assemblie
50. A Network based training Tool for electrical Engineer's Education
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