1. Achieving low noise in scanning tunneling spectroscopy.
- Author
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Ge, Jian-Feng, Ovadia, Maoz, and Hoffman, Jennifer E.
- Subjects
- *
SCANNING tunneling microscopy , *ATOMIC structure , *SIGNAL-to-noise ratio , *NOISE - Abstract
Scanning tunneling microscopy/spectroscopy (STM/S) is a powerful experimental tool to understand the electronic structure of materials at the atomic scale, with energy resolution down to the microelectronvolt range. Such resolution requires a low-vibration laboratory, low-noise electronics, and a cryogenic environment. Here, we present a thorough enumeration and analysis of various noise sources and their contributions to the noise floor of STM/S measurements. We provide a comprehensive recipe and an interactive python notebook to input and evaluate noise data, and to formulate a custom step-by-step approach for optimizing the signal-to-noise ratio in STM/S measurements. [ABSTRACT FROM AUTHOR]
- Published
- 2019
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