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185 results on '"Lee, T.L."'

10. Oxygen-Redox Activity in Non-Lithium-Excess Tungsten-Doped LiNiO2 Cathode

Author

Menon, A.S., primary, Johnston, B.J., additional, Booth, S.G., additional, Zhang, L., additional, Kress, K., additional, Murdock, B.E., additional, Paez Fajardo, G., additional, Anthonisamy, N.N., additional, Tapia-Ruiz, N., additional, Agrestini, S., additional, Garcia-Fernandez, M., additional, Zhou, K., additional, Thakur, P.K., additional, Lee, T.L., additional, Nedoma, A.J., additional, Cussen, S.A., additional, and Piper, L.F.J., additional

Published
2023
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11. A 3nm CMOS FinFlex™ Platform Technology with Enhanced Power Efficiency and Performance for Mobile SoC and High Performance Computing Applications

Author

Wu, Shien-Yang, primary, Chang, C.H., additional, Chiang, M.C., additional, Lin, C.Y., additional, Liaw, J.J., additional, Cheng, J.Y., additional, Yeh, J.Y., additional, Chen, H.F., additional, Chang, S.Y., additional, Lai, K.T., additional, Liang, M.S., additional, Pan, K.H., additional, Chen, J.H., additional, Chang, V.S., additional, Luo, T.C., additional, Wang, X., additional, Mor, Y.S., additional, Lin, C.I., additional, Wang, S.H., additional, Hsieh, M.Y., additional, Chen, C.Y., additional, Wu, B.F., additional, Lin, C.J., additional, Liang, C.S., additional, Tsao, C.P., additional, Li, C.T., additional, Chen, C.H., additional, Hsieh, C.H., additional, Liu, H.H., additional, Chen, P.N., additional, Chen, C.C., additional, Chen, R., additional, Yeo, Y.C., additional, Chui, C.O., additional, Chang, W., additional, Lee, T.L., additional, Huang, K.B., additional, Lin, H.J., additional, Chen, K.W., additional, Tsai, M.H., additional, Chen, K.S., additional, Chen, X.M., additional, Cheng, Y.K., additional, Wang, C.H., additional, Shue, W., additional, Ku, Y., additional, Jang, S. M., additional, Cao, M., additional, Lu, L.C., additional, and Chang, T.S., additional

Published
2022
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12. Critical Process Features Enabling Aggressive Contacted Gate Pitch Scaling for 3nm CMOS Technology and Beyond

Author

Chang, Chih-Hao, primary, Chang, V.S., additional, Pan, K.H., additional, Lai, K.T., additional, Lu, J. H., additional, Ng, J.A., additional, Chen, C.Y., additional, Wu, B.F., additional, Lin, C.J., additional, Liang, C.S., additional, Tsao, C.P., additional, Mor, Y.S., additional, Li, C.T., additional, Lin, T.C., additional, Hsieh, C.H., additional, Chen, P.N., additional, Hsu, H.H., additional, Chen, J.H., additional, Chen, H.F., additional, Yeh, J.Y., additional, Chiang, M.C., additional, Lin, C.Y., additional, Liaw, J.J., additional, Wang, C.H., additional, Lee, S.B., additional, Chen, C.C., additional, Lin, H.J., additional, Chen, R., additional, Chen, K.W., additional, Chui, C.O., additional, Yeo, Y.C., additional, Huang, K.B., additional, Lee, T.L., additional, Tsai, M.H., additional, Chen, K.S., additional, Lu, Y.C., additional, Jang, S.M., additional, and Wu, S.-Y., additional

Published
2022
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14. (Composite of) A Map Of The Extremity Of Cape Cod Including the Townships of Provincetown & Truro: A Chart Of Their Sea Coast And Of Cape Cod Harbour, State of Massachusetts. Executed under the direction of Major J.D. Graham U.S. Top. Engs. During portions of the years 1833,'34, &'35 ... W.J. Stone Sc. Wash. Surveyed And Projected By J.D. Graham ... Drawn From The Original Projects And Notes, By J.E. Johnston ... A.A. Humphreys .... J.. Macomb ... W.R. Palmer ... Reduced from the original in the Bureau of U.S. Topographical Engineers, Washington, by Wash: Hood 1836.

Author

Hood, Washington, Graham, Maj. J.D., Humphreys, A.A., Stone, W.J., Graham, J.D., Izard, J.F., Lee, T.L., Macomb, J.N., Johnston, J.E., Henderson, J.E., and Palmer, W.R.

Subjects
Nautical Charts
Abstract

Composite of all four sheets. Huge 4 part chart, each 78 x 94 cm., beautifully engraved by Hood. Not in Phillips or Claussen & Friis. A major chart which was compiled by many of the topographical engineers who went on to become famous figures in western mapping and exploration: Graham, Macomb, Johnston, Humphreys, Palmer and Henderson. Hood's engraving is extremely clear and well done. 25th Congress, 2nd Session, House Document 121. Chart is without color. Relief shown by hachures and spot heights. Depths shown by isolines and soundings. Includes notes, references, and 2 diagrams of the tides at high and low water in Cape Cod Harbor for the months of Oct. 1833 and June 1835., Huge 4 part chart beautifully engraved by Hood. Not in Phillips or Claussen & Friis. A major chart which was compiled by many of the topographical engineers who went on to become famous figures in western mapping and exploration: Graham, Macomb, Johnston, Humphreys, Palmer and Henderson. Hood's engraving is extremely clear and well done. 25th Congress, 2nd Session, House Document 121., Guthorn p15.

Published
1836

15. A Map Of The Extremity Of Cape Cod Including the Townships of Provincetown & Truro: A Chart Of Their Sea Coast And Of Cape Cod Harbour, State of Massachusetts. Executed under the direction of Major J.D. Graham U.S. Top. Engs. During portions of the years 1833,'34, &'35 ... W.J. Stone Sc. Wash. Surveyed And Projected By J.D. Graham ... Drawn From The Original Projects And Notes, By J.E. Johnston ... A.A. Humphreys .... J.. Macomb ... W.R. Palmer ... Reduced from the original in the Bureau of U.S. Topographical Engineers, Washington, by Wash: Hood 1836.

Author

Hood, Washington, Graham, Maj. J.D., Humphreys, A.A., Stone, W.J., Graham, J.D., Izard, J.F., Lee, T.L., Macomb, J.N., Johnston, J.E., Henderson, J.E., and Palmer, W.R.

Subjects
Nautical Charts
Abstract

Lower left sheet. Huge 4 part chart, each 78 x 94 cm., beautifully engraved by Hood. Not in Phillips or Claussen & Friis. A major chart which was compiled by many of the topographical engineers who went on to become famous figures in western mapping and exploration: Graham, Macomb, Johnston, Humphreys, Palmer and Henderson. Hood's engraving is extremely clear and well done. 25th Congress, 2nd Session, House Document 121. Chart is without color. Relief shown by hachures and spot heights. Depths shown by isolines and soundings. Includes notes, references, and 2 diagrams of the tides at high and low water in Cape Cod Harbor for the months of Oct. 1833 and June 1835., Huge 4 part chart beautifully engraved by Hood. Not in Phillips or Claussen & Friis. A major chart which was compiled by many of the topographical engineers who went on to become famous figures in western mapping and exploration: Graham, Macomb, Johnston, Humphreys, Palmer and Henderson. Hood's engraving is extremely clear and well done. 25th Congress, 2nd Session, House Document 121., Guthorn p15.

Published
1836

23. Tidal level forecasting during Typhoon surge using functional and sequential learning neural networks

Author

Rajasekaran, S., Lee, T.L., and Jeng, D.-S.

Subjects
Neural networks -- Analysis, Typhoons -- Analysis, Typhoons -- Taiwan, Neural network, Engineering and manufacturing industries, Science and technology
Abstract

This note presents the application of the functional network (FN) and the sequential learning neural network (SLNN) for accurate prediction of tides during surge using short-term observation. Based on 34-day observed data, the proposed functional network model can predict the time series data of hourly tides directly, using an efficient learning process that minimizes the error. In the functional network, a simple equation in the form of a finite-difference equation is derived, using the tidal levels at two previous time steps. The sequential learning neural network uses one hidden neuron to predict the current tidal level. Hourly tidal data for the Typhoon Herb, measured at Taichung Harbor along the Taiwan coastal region, is used for testing the capacity of the functional network and sequential neural network models. Numerical results demonstrate that the proposed models can predict the tidal level during typhoon surge with a high correlation coefficient, based on 1-month hourly data. DOI: 10.1061/(ASCE)0733-950X(2005) 131:6(321) CE Database subject headings: Typhoons; Surge; Neural networks; Tidal water; Forecasting; Taiwan.

Published
2005

24. Klebsiella infection in patients with thalassemia. (Major Article)

Author

Chung, B.H.V., Ha, S.Y., Chan, G.C.F., Chiang, A., Lee, T.L., Ho, H.K., Lee, C.Y., Luk, C.W., and Lau, Y.L.

Subjects
Klebsiella -- Risk factors, Klebsiella -- Drug therapy, Klebsiella -- Patient outcomes, Thalassemia -- Research, Thalassemia -- Physiological aspects, Genetic disorders -- Research, Blood transfusion -- Adverse and side effects, Splenectomy, Health, Health care industry
Published
2003

28. Nanometer thick Si/SiGe strained-layer superlattices grown by an ultrahigh vacuum/chemical vapor deposition technique

Author

Chang, T.C., Chang, C.Y., Jung, T.G., Tsai, W.C., Wang, P.J., Lee, T.L., and Chen L.J.

Subjects
Thin films, Multilayered -- Design and construction, Transmission electron microscopes -- Usage, X-ray diffractometer -- Methods, Physics
Abstract

Ultrahigh vacuum/chemical vapor deposition system (UHV/CVD) facilitated the growth of high quality Si/Si(1-x)Ge(x) superlattices with 1.5 nanometer thin layers. X-ray diffraction and transmission electron microscopy were used to analyze the crystalline quality.

Published
1994

29. Interfacial reactions in ultrahigh vacuum deposited Y-Si multilayer thin films

Author

Lee, T.L. and Chen, L.J.

Subjects
Thin films, Multilayered -- Research, Electron microscopy -- Analysis, Electrons -- Diffraction, Physics
Abstract

Conventional and high-resolution transmission electron microscopy, Auger electron spectroscopy and X-ray diffraction are used to study interfacial reactions that occur in ultrahigh vacuum deposited Y-Si multilayer thin films. Multilayers composed of YSi2 form a 65-nm-thick amorphous Y-Si intermixing layer at room temperature. Annealing of the samples at 250-350 degrees Celsius leads to homogenization of atomic composition, although the multilayer maintains its amorphous state.

Published
1994

30. Interfacial reactions of ultrahigh vacuum deposited yttrium thin films on (111)Si at low temperatures

Author

Lee, T.L. and Chen, L.J.

Subjects
Thin films -- Research, Yttrium -- Analysis, Silicon crystals -- Research, Transmission electron microscopes -- Usage, Physics
Abstract

The low-temperature behavior of ultrahigh vacuum deposited yttrium thin films on an atomically clean (111)Si substrate was investigated. Experiments were performed wherein yttrium thin films were deposited on an atomically clean, phosphorous-doped (111)Si substrate at room temperature. The profile of the resulting structure was then analyzed by high-resolution transmission electron microscopy. Results show that the thickness of the thin films is strongly dependent on the annealing time and temperature.

Published
1993

31. Evolution of vacancy ordering and defect structure in epitaxial YSi 2-x thinfilms on (111)Si

Author

Lee, T.L., Chen, L.J., and Chen, F.R.

Subjects
Thin films -- Research, Physics
Abstract

Conventional and high-resolution transmission electronmicroscopy were used to analyze the evolution of vacancy ordering and defect structure in epitaxial YSi thin films on Si. Epitaxial YSi 2-x were formed whensamples were annealed at 500 degrees celsius for 120 seconds. When the temperature reached 600 degrees celsius for a period of 15 seconds, an ordered vacancy superstructure was formed and additional diffraction spots appeared. Atthe same temperature but for longer periods, or at higher temperatures, an out-of-step structure was formed and the extra diffraction spots were split.

Published
1992

35. Characterization of the residual stresses in spray-formed steels using neutron diffraction

Author

Lee, T.L., Mi, J., Zhao, S.L., Fan, J.F., Zhang, S.Y., Kabra, S., and Grant, P.S.

Subjects
Residual stresses, Materials Science(all), Finite element analysis, Spray forming, Three-dimensional tomography, Condensed Matter Physics, Neutron diffraction
Abstract

Neutron diffraction was used to characterize the residual stresses in an as-sprayed tube-shaped steel preform. The measured residual stress distributions were compared with those simulated using finite element method by taking into account the effects of the thermal history, porosity and different phases of the sprayed preform. The porosity was measured using X-ray microcomputed tomography. The study revealed for the first time the correlation between the distribution of porosity and residual stress developed in the as-sprayed preform.

Published
2015
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40. Formation of amorphous interlayers in ultrahigh vacuum deposited yttrium thin films on (111)Si

Author

Lee, T.L. and Chen, L.J.

Subjects
Thin films -- Research, Amorphous semiconductors -- Research, Physics
Abstract

The formation of amorphous interlayers in yttrium thin films grown by ultrahigh vacuum deposition on (111)Si substrates was investigated. The results showed that the thickness of the amorphous interlayer increased with greater annealing times and temperatures. As the critical thickness was surpassed, further intermixing between Y and Si took place but was eventually superseded by crystalline phase formation.

Published
1993

41. Investigation of strain relaxation mechanisms and transport properties in epitaxial SmNi[O.sub.3] films

Author

Conchon, F., Boulle, A., Guinebretiere, R., Dooryhee, E., Hodeau, J.-L., Girardot, C., Pignard, S., Kreisel, J., Weiss, F., Libralesso, L., and Lee, T.L.

Subjects
Chemical vapor deposition -- Analysis, Nickel alloys -- Mechanical properties, Nickel alloys -- Electric properties, Samarium -- Mechanical properties, Samarium -- Electric properties, Shear (Mechanics) -- Analysis, Physics
Abstract

The strain relaxation in SmNi[O.sub.3] epitaxial films deposited by chemical vapor deposition on SrTi[O.sub.3] substrates is studied. A phenomenological model is used for particular planar faults that give rise to extended diffuse scattering on transverse scans.

Published
2008

44. Fine-mapping of the mouse ApoB regulator gene 1 (Abrg1) locus, which regulates plasma apoB levels, to a 2-cM segment of chromosome 6

Author

Huang, L.S., Lee, T.L., McQuade, M., Luo, N., Lau, P.W., Ko, C., and Chua, S.C. Jr.

Subjects
Human genetics -- Research, Human chromosome abnormalities -- Research, Genetic disorders -- Research, Chromosome mapping -- Usage, Apolipoproteins -- Genetic aspects, Atherosclerosis -- Genetic aspects, Coronary heart disease -- Genetic aspects, Mice -- Genetic aspects, Biological sciences
Published
2001

45. An enhanced 16nm CMOS technology featuring 2nd generation FinFET transistors and advanced Cu/low-k interconnect for low power and high performance applications

Author

Wu, Shien-Yang, primary, Lin, C.Y., additional, Chiang, M.C., additional, Liaw, J.J., additional, Cheng, J.Y., additional, Yang, S.H., additional, Chang, S.Z., additional, Liang, M., additional, Miyashita, T., additional, Tsai, C.H., additional, Chang, C.H., additional, Chang, V.S., additional, Wu, Y.K., additional, Chen, J.H., additional, Chen, H.F., additional, Chang, S.Y., additional, Pan, K.H., additional, Tsui, R.F., additional, Yao, C.H., additional, Ting, K.C., additional, Yamamoto, T., additional, Huang, H.T., additional, Lee, T.L., additional, Lee, C.H., additional, Chang, W., additional, Lee, H.M., additional, Chen, C.C., additional, Chang, T., additional, Chen, R., additional, Chiu, Y.H., additional, Tsai, M.H., additional, Jang, S. M., additional, Chen, K.S., additional, and Ku, Y., additional

Published
2014
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46. A 16nm FinFET CMOS Technology for Mobile SoC and Computing Applications

Author

Wu, S.–Y., primary, Lin, C.Y., additional, Chiang, M.C., additional, Liaw, J.J., additional, Cheng, J.Y., additional, Yang, S.H., additional, Yao, C.H., additional, Lee, T.L., additional, Chang, W., additional, Chen, C.C., additional, Tsai, M.H., additional, Jang, S.M., additional, Chen, K.S., additional, and Ku, Y., additional

Published
2014
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47. Investigation of strain and strain relaxation in fuctional epitaxial oxides using X-ray scattering techniques

Author

Conchon, Florine, Boulle, Alexandre, Guinebretière, René, Pignard, S., Girardot, C., Hodeau, Jean-Louis, Libralesso, L., Lee, T.L., Segear, Martine, Science des Procédés Céramiques et de Traitements de Surface (SPCTS), Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Axe 3 : organisation structurale multiéchelle des matériaux, and Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Ecole Nationale Supérieure de Céramique Industrielle (ENSCI)-Institut des Procédés Appliqués aux Matériaux (IPAM)

Subjects
[PHYS] Physics [physics]
Published
2007

48. Polarity determination of a GaN thin film on sapphire (0001) with x-ray standing waves.

Author

Kazimirov, A., Scherb, G., Zegenhagen, J., Lee, T.L., Bedzyk, M.J., Kelly, M.K., Angerer, H., and Ambacher, O.

Subjects
PHYSICS experiments
Abstract

Describes the polarity of a 1 um thick GaN film grown by molecular beam epitaxy on an single crystal using the x-ray standing wave method. How the standing was generated from the GaN film; Qualities of noncentrosymmetric compound crystals; What perfect single crystals exhibit.

Published
1998
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