390 results on '"Schmitz, Jurriaan"'
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2. Characterisation of Photodiodes in 22 nm FDSOI at 850 nm
3. Recovery after hot-carrier injection: Slow versus fast traps
4. A UV Sensitive Integrated Micromegas with Timepix Readout
5. An integrated Micromegas UV-photon detector
6. Towards understanding recovery of hot-carrier induced degradation
7. Corrigendum to “Inaccuracies in contact resistivity from the Cox–Strack method: A review” [Sol. Energy Mater. Sol. Cells 246 (2022) 111909]
8. Low temperature thin films for next-generation microelectronics (invited)
9. Material properties of LPCVD processed n-type polysilicon passivating contacts and its application in PERPoly industrial bifacial solar cells
10. Study of screen printed metallization for polysilicon based passivating contacts
11. Observations on the recovery of hot carrier degradation of hydrogen/deuterium passivated nMOSFETs
12. In-depth analysis of potential-induced degradation in a commercial CIGS
13. Process induced poling and plasma induced damage of thin film PZT
14. In‐depth analysis of potential‐induced degradation in a commercial CIGS PV module
15. Fabrication and properties of GeSi and SiON layers for above-IC integrated optics
16. Inaccuracies in contact resistivity from the Cox–Strack method: A review
17. Review of technology specific degradation in crystalline silicon, cadmium telluride, copper indium gallium selenide, dye sensitised, organic and perovskite solar cells in photovoltaic modules: Understanding how reliability improvements in mature technologies can enhance emerging technologies
18. Deposition and properties of silicon oxynitride films with low propagation losses by inductively coupled PECVD at 150 °C
19. Post‐mortem analysis of a commercial Copper Indium Gallium Diselenide (CIGS) photovoltaic module after potential induced degradation
20. An integrated Micromegas UV-photon detector
21. A UV sensitive integrated Micromegas with Timepix readout
22. Qualitative and quantitative characterization of outgassing from SU-8
23. Charge carrier transport and electroluminescence in atomic layer deposited poly-GaN/c-Si heterojunction diodes.
24. Low-temperature fabricated TFTs on polysilicon stripes
25. Interface States Characterization of UTB SOI MOSFETs From the Subthreshold Current
26. MOSFET degradation under RF stress
27. Center-shift method for the characterization of dielectric charging in RF MEMS capacitive switches
28. Application and evaluation of the RF charge-pumping technique
29. Influence of dislocation loops on the near-infrared light emission from silicon diodes
30. Microchip Post-Processing: There is Plenty of Room at the Top
31. Adding functionality to microchips by wafer post-processing
32. Test structure design considerations for RF-CV measurements on leaky dielectrics
33. Anomalous Scaling of Parasitic Capacitance in FETs with a High-K Channel Material
34. Conduction and Electric Field Effect in Ultra-Thin Tungsten Films
35. Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices
36. On the Accuracy of the Cox–Strack Equation and Method for Contact Resistivity Determination
37. Engineering of Dislocation-Loops for Light Emission from Silicon Diodes
38. Influence of Interface Recombination in Light Emission from Lateral Si-Based Light Emitting Devices
39. Langmuir-probe Characterization of an Inductively-Coupled Remote Plasma System intended for CVD and ALD
40. On the Growth of Native Oxides on Hydrogen-Terminated Silicon Surfaces in Dark and Under Illumination with Light
41. Influence of Interface Recombination in Light Emission from Lateral Si-Based Light Emitting Devices
42. On the Verification of EEDFs in Plasmas with Silane using Optical Emission Spectroscopy
43. Nano-Link Based Ultra Low Power Micro Electronic Hotplates for Sensors and Actuators
44. RFID Tag Failure after Thermal Overstress
45. An approach to modeling of silicon oxidationin a wet ultra-diluted ambient
46. In-situ study of ammonium bromide formation for optimizing boron nitride ALD from BBr3 and NH3
47. Opto-electronic modeling of light emission from avalanche-mode silicon p+n junctions.
48. Characterization of Green Laser Crystallized GeSi Thin Films
49. How hot is the wire: Optical, electrical, and combined methods to determine filament temperature
50. Electrical characterization of hot-wire assisted atomic layer deposited Tungsten films
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