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This article discusses the use of compression-mount connectors in RF and microwave systems and emphasizes the importance of proper alignment. The article explains that manufacturing variations can affect performance at high frequencies, making alignment crucial. Compression-mount connectors offer advantages such as ease of use, reusability, and performance. The article demonstrates the impact of misalignment on connector performance and explains how visual alignment guides can improve assembly and yield. Proper alignment is essential to avoid impedance discontinuities and ensure reliable connections in small compression-mount connectors. [Extracted from the article]

The article highlights the importance of test equipment keeping pace with the increasing complexity and frequencies of wireless signals. It mentions the need for higher frequency and advanced signal format support as wireless applications move into the millimeter-wave range. The article provides examples of test equipment, such as portable spectrum analyzers and signal generators, that are designed for wireless testing, including for 5G networks and Wi-Fi systems. It also mentions companies that offer wireless testing services and test equipment rentals. Additionally, the article briefly mentions a kit offered by a company that includes various tools and accessories for testing and charging, without providing further details about the company or the specific use of these tools. [Extracted from the article]

The article discusses the need for faster time-to-insight in the testing and validation of PCIe (PCI Express) standards. As each new generation of PCIe doubles the data rate of the previous generation, validation engineers face challenges in ensuring the performance of their PHYs, chips, cards, and systems. While existing testing equipment has improved, it has also increased testing complexities and debug times. The article highlights the need for tools that provide faster time-to-insight and superior ease-of-use without significantly impacting budgets. It also addresses the expected labor gap in the engineering workforce and the need for equipment that requires less training and expertise to operate. Additionally, the article mentions the significant costs associated with acquiring testing equipment and the need for cost-effective solutions. The TMT4 Margin Tester developed by Tektronix is presented as a supplemental solution that addresses these needs in PCIe testing. [Extracted from the article]

The article offers information on several aspects associated with an universal serial bus (USB) powered radio frequency (RF) test instruments which are bringing measurements with less size and cost than traditional equipment. The topics addressed include details on USB vector network analysers (VNAs), such as the TTR500 series from Tektronix Inc. which provide cost-effective, simple-to-perform two-port vector network measurements with a USB connection and control of a laptop computer.

The article offers brief information on several military test equipment including the M3302A arbitrary waveform generator (AWG) from Keysight Technologies, the UHFAWG AWG from Zurich Instruments, and the CTS-6010 tactical radio test set from Astronics.

The article discusses the applications and uses of eXtensions for Instrumentation (PXI)-based technology in the automated test industry. The ability of PXI-based test set ups to be customized with the instrumentation modules to meet different test requirements is provided. The availability of PXI-based test solutions designed to provide the capability required to test and characterize next-generation devices is mentioned.

The article offers brief information on various testing equipment including the CT4121 FET probe, the DCSR4000-8 Voltage-Controlled Oscillator (VCO) and the TA1164 Broadband solid-state power amplifier from testing firms Cal Test Electronics Inc., Synergy Microwave Corp. and Triad RF Systems Inc.

The article focuses on advances in wireless communications systems. Topics discussed include how these advances have push test-equipment suppliers to produce flexible, compute-intensive tools; wireless communications systems involved cellular radio networks built from multiple base stations with good signal-to-noise (SNR) performance; and the use of smaller cells to offload traffic from a macrocell in areas of heavy use such as at airports, shopping centers and sports establishments.

The article focuses on how to choose an amplifier for use with test instruments. Topics discussed include why it requires a unit with characteristics that optimally measure up to a particular application; why broadband amplifiers must overcome some complex design challenges; and the cost of a broadband amplifier that may be 20 times that of a narrowband amplifier.

The article evaluates several measurement systems for military and aerospace systems including the R&S TS6710 radar tester from Rohde and Schwarz, the Mathematical software Mathcad from Parametric Technology Corp., and the OpenVPX modular systems from Mercury Systems.

The article discusses how to model the measurement uncertainty to provide assurance that designs meet their required performance. It says that designers apply a guard band around a performance parameter to account for the difference between the acceptance test limit of the device under test(DUT) and the performance limit of the test equipment. Meanwhile, the calibration factor is printed on a power sensor's label or stored in an electronically erasable programmable read-only memory (EEPROM).

The article discusses the increase in the use of modular test instrument for radio frequency (RF) and microwave instruments. Agilent Technologies Inc. RF and Microwave applications engineer Mike Millhaem states that modular test equipments has several advantages such as smaller footprint, lower costs, and faster execution speeds. Furthermore, Aeroflex Test Solutions Group product manager Hiren Joshi, says that these instruments result in faster instrument development to meet market demands.

The article discusses manufacturing test requirements for Wi-MAX and wireless local-area-network (WLAN) devices. It notes that common test solutions are composed of three independent elements including chipset control software from the integrated-circuit (IC) vendor, test equipment, and the test software. It adds that test equipment vendors integrated the elements save test engineers' time. It also presents three common examples of manufacturing systems requiring chipset-specific software.

The article evaluates a pulsed load-pull (PLP) and a pulsed current-voltage (PIV) system used for testing high-power transistors from FOCUS Microwaves Inc.

The article discusses the use of pulsed current-voltage (I-V) testing to characterize radio frequency (RF) devices through single-pulse measurements. The move is relatively cost effective and avoids the negative effects of self-heating and transient trapped charges. It states that the pulsed I-V testing is based on the use of a pulsed source to stimulate a transistor or device under test (DUT) which is followed by a pulse measurement on the device.

The article discusses the testing of oscillator, which provides the timing pulse for measurement instrumentation and other range of consumer electronics, by using ripple injection supply. The testing includes different methods of modulating, of which phase noise test sets, spectrum analyzers, power supplies and signal sources are used to determine the susceptibility of oscillator. Oscillators have the likelihood to be susceptible by noise on the power supply line.

The article presents the basic guidelines for assembling an effective radio frequency (RF) and microwave automated test equipment (ATE) system. Configuring an RF/microwave ATE system involves addressing a number of key requirements, determined by the type of device under test. Constructing an RF/microwave ATE system at one time automatically involved the use of the industry-standard IEEE-488 or general-purpose instrumentation bus interface.

Presents information on the design and development of power amplifiers (PA). Background on the use of PA by mobile communication designers; Calibration methods utilized by mobile manufacturers in introducing the necessary phase and amplitude versus time measurement into manufacturing test; Features of an eight-state phase-shift-keying modulation format adopted by the European Telecommunication Standards Institute.

Discusses the development of an automated test system (ATS) that improves the reliability of helicopter avionics cables and connectors while accelerating production measurements in Boeing Army Rotorcraft Systems. Efforts to upgrade the company's manual test equipment with automated functional test procedures; Functions of the automated test system; Advantages of ATS over other methods.

Discusses the growth of Narda Microwave, a U.S.-based supplier of microwave components and test instruments, from 1953 to 2004. Founders of Narda Microwave; Information on the high-level product of the company; Number of company employees in 1957; Acquisition of Narda by Loral Corp. in 1983.

The article outlines several signal generators for radio frequency (RF)/microwave testing. It says that Agilent Technologies Inc.'s E8267D PSG signal generator provides all major digital modulation formats with a modulation bandwidth of 160 megahertz (MHz). Meanwhile, National Instruments Corp.' NI565x series of modular signal generator is based n the PXI format, with a control module to create.

An interview with John Regazzi, who has been the chief executive officer (CEO) and director of Giga-tronics Inc., is presented. When asked on how the test and measurement industry changed, he mentions that the microwave test industry has become more mature. He mentions that Giga-tronics provides general-purpose test equipment at customers' request. He offers insight on the aircraft upgrades like F-18 and on the role of filter in solving interference problems between major airplane subsystems.

The article provides information on developments in radio frequency (RF) and microwave test equipment and software. At the AutoTestCon show held in Baltimore, Maryland from September 18-20, 2007, Agilent Technologies announced the latest news on the Agilent Virtual Rack platform. The local-area-network (LAN)-based standard LAN Extension for Instrumentation (LXI) is gaining momentum in a wide range of commercial and military automatic-test equipment (ATE) applications.

Features several testing equipment. DPO7000 series of digital phosphor oscilloscopes from Tektronix; WaveExpert series of oscilloscopes from LeCroy; U3771 and U3772 portable spectrum analyzers from Advantest; LabVIEW programming software; N8241A arbitrary waveform generator and the N8201A frequency downconverter from Agilent Technologies.

The article evaluates the R180 vector network analyzer (VNA) from microwave test equipment provider Copper Mountain Technologies and outlines its features.

The article discusses simulation and test products for modern radar systems which include radar test solutions from Tektronix Inc., the Series 1100 radar target simulator from Eastern OptX Inc. and radar system design software from MathWorks Inc.

The article offers information on study by Frost & Sullivan, a test equipment research firm, on several instruments used by engineers to test hands off between wireless access points. Topics discussed include prediction on increase in market for heterogeneous networks (HetNets) testing equipments by 2022, breakdown suffered by HetNets when handing off between cellular and small-cell Wireless LANs networks and prediction on installation of Long-Term Evolution (LTE) in China and Asia.

The article offers information on the vector network analyzer. It mentions that its is considered a test instrument in the radio frequency(RF)/microwave industry used in manufacturing production testing and validation of design. An overview of the explanation on the analyzer by test equipment provider Tektronix Inc. is also presented.

The article evaluates several products including the global positioning system antenna EtherHelixGPS from Ethertronics Inc., the ATS portable test instruments for digital radio testing, from Astronics Test Systems Inc., and the low noise amplifier SKY67103-396LF from Skyworks Solutions Inc.

The article offers brief information on several software-enhanced test systems including Component Test System from Auriga, Focus Device Characterization Suite (FDCS) from Focus Microwaves and Automated Characterization Suite from Keithley Instruments Inc.

The article focuses on effective ways to perform over-the-air (OTA) testing of massive MIMO base stations. It is stated that the challenge of performing OTA testing is made daunting due to the physical size of massive MIMO arrays. It is noted that the number of OTA test antennas must be equal or greater than the number of antenna array elements for a test facility.

The article focuses on developments regarding high-performance in smaller electronic devices. It is mentioned that as can be proven by the number of portable test instruments, the smaller-sized product trend pertains to test-and-measurement equipment. It is noted that portable spectrum analyzers, which can be connected to a laptop or desktop computer are now being offered by a number of suppliers.

The article describes how modern components and subsystems must often be tested for a multitude of different characteristics, often requiring disparate test systems to make the required measurements. It notes that the ZT-20X6NB boasts enough digital interfaces for connection to almost any PC. This switch matrix has reportedly been built to last, with excellent long-term reliability and minimal degradation in electrical performance.

The article reports on vector network analyzers (VNAs) that are key test instruments in the radio frequency (RF)/microwave industry. VNAs measure the amplitude and phase responses of active and passive RF/microwave devices and produce plots versus frequency that can be very revealing. It highlights ShockLine Series of VNAs from Anritsu Co.

The article discusses the latest challenges in attenuator design. Attenuator designers are now being asked to fit higher-frequency and higher-power signals through various antenna technologies. In addition, the demand for components at lower prices is also increasing. Latest attenuator technology facilitates high precision, small integrated-circuit (IC) footprints, digital control, and programmability while being packed in modules that are complete with amplifiers and filters.

The article evaluates the 8-b TADC-1000 ADC testing equipment from Tektronix Component Solutions.

The author discusses aspects of broadband active and passive components in performing invaluable signal-processing and translation functions. It outlines several components including mode ZFRSC-183+ two-way power splitter/combiner for Mini-Circuits, Krytar Inc.'s coaxial directional couplers and RF-Lambda's power amplifiers with manual and digital control interfaces.

The article reports on the challenges facing the test-and-measurement equipment designers in providing practical solutions. It cites an increase in on-site measurements, which require an increasing number of portable radio frequency (RF)/microwave test equipment. It highlights several manufacturers that respond to the market needs such as Agilent Technologies Inc., which offers a portable FiledFox spectrum and Anritsu Co., which introduces Site Master portable RF/microwave testers.

The article focuses on the changes observed in various test equipment manufacturers particularly the measurement instruments they offer. It mentions that the Wiltron Co. recognized as one of the companies which pioneered the test equipment industry was acquired by various companies including The Singer Manufacturing Co., Pacific Measurements, and Systron Donner Co. It examines the history of the first test equipments available like the 792-AFE automatic noise-figure meter of Kay Electric Co.

The article focuses on the test-equipment components which can be considered for measuring various it's in a particular test system. It states that the components for test should offer instrument-grade performance like the attenuators that must provide excellent impedance match relative to the voltage standing wave ratio (VSWR). It says that various companies within the component manufacturing industry supply different components which maintain performance tolerance and manufacturing.

The article offers information on the use of the peripheral component interconnect (PCI) eXtensions for Instrumentation (PXI) open standard in modular testing instruments. It says PXI-based modular instruments are rugged, low cost, and delivers high-performance measurement and automation of systems. Agilent Technologies Inc. Radio Frequency (RF) and Microwave applications engineer Mike Millhaem says that PXIs provides a good starting point for RF and Microwave modular instruments.

The article evaluates several building blocks for a Universal Serial Bus (USB) automatic-test-equipment (ATE) system from Telemakus including the TEA4000-7 digital attenuator, TED6000-50 power meter/sensor, and TES6000-30 USB-controlled single-pole, double throw (SPDT) switch.

A letter to the editor and a response from the editor are presented about the quality of radio frequency (RF)/microwave test equipment.

Information on the Long Island RF/Microwave Symposium hosted by the professional Institute of Electrical and Electronics Engineers (IEEE) that was held in Hauppauge, New York on April 14, 2016 is presented. Topics mentioned include reflectionless filters, tunable ferroelectric devices and digital pre-distortion. Test-and-measurement equipment pieces were exhibited by manufacturers in radio frequency (RF)/microwave industry. Speakers at the event include Jesse Taub and Dr. Robert Caverly.

The article evaluates several daio frequency/microwave test equipment including the model PSG E8257D signal generator from Agilent Technologies Inc., 2500B series of microwave signal generators from Giga-Tronics Inc., and VectorStar model ME7828A vector network analyzers from Anritsu Co.

The article discusses the local-area-networks eXtensions for Instrumentation (LXI) standard, as replacement for the General Purpose Interface Bus. The author explains that the standards are used for easy electronic test equipment and LAN link control. It was developed by LXI Consortium members with Von Campbell as president.

Provides information on a diversified collection of hardware, software, and test equipment which represents those that are created in 2003. Companies that continue to develop cost-effective products with high-performance levels in the electronics industry; Features of RF Design Environment software tools from Agilent Technologies; Switching speed capability of the ADV-3000S DDS source from Advanced Radio Corp. INSET: Top Products of 2003 at a glance (listed alphabetically).

A letter to the editor is presented suggesting some kind of blog or series on test equipment and measurement techniques that could be used to keep pace with new technologies in microwaves and radio frequency (RF).

In this article, the author discusses test instruments in modular form from audio through microwave frequencies which are being used by Commercial, industrial, and military users and presents modular test equipment users are as part of the next generation of engineers.