13 results on '"Sohn, D.K."'
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2. A 12nm FinFET Technology Featuring 2nd Generation FinFET for Low Power and High Performance Applications
3. Bulk planar 20nm high-k/metal gate CMOS technology platform for low power and high performance applications
4. Study of stress migration and electromigration interaction in copper/low-κ interconnects
5. Study of upstream electromigration bimodality and its improvement in Cu low-k interconnects
6. A novel methodology to analyze time-dependent dielectric breakdown failure mechanism of copper/low-k interconnects
7. The effects of dielectric slots on Copper/Low-k interconnects reliability
8. Effect of chemical mechanical polishing scratch on TDDB reliability and its reduction in 45nm BEOL process
9. TDDB robustness of highly dense 65NM BEOL vertical natural capacitor with competitive area capacitance for RF and mixed-signal applications
10. Impact of Interstitial Carbon on Base Current Ideality in SiGe:C Heterojunction Bipolar Transistors
11. Design, Assembly and Reliability of Large Die (21 x 21mm2) and Fine-pitch (150pm) Cu/Low-K Flip Chip Package.
12. Optimization of reliability of copper-low-k flip chip package with variable interconnect compliance.
13. Aggressively scaled high-k last metal gate stack with low variability for 20nm logic high performance and low power applications.
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