30 results on '"Collins, R."'
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2. In situ ellipsometry comparison of the nucleation and growth of sputtered and glow-discharge a-Si:H.
3. Effect of deposition conditions on the nucleation and growth of glow-discharge a-Si:H.
4. The nucleation and growth of glow-discharge hydrogenated amorphous silicon.
5. Optical properties of dense thin-film Si and Ge prepared by ion-beam sputtering.
6. An ellipsometry study of a hydrogenated amorphous silicon based n-i structure.
7. Real time spectroscopic ellipsometry characterization of the nucleation of diamond by filament-assisted chemical vapor deposition.
8. Surface roughness evolution on glow discharge a-Si:H.
9. Through-the-glass optical metrology for mapping 60 cm × 120 cm CdTe photovoltaic panels in off-line and on-line configurations.
10. Real time and post-deposition optical analysis of interfaces in CdTe solar cells.
11. Growth analysis of (Ag,Cu)InSe2 thin films via real time spectroscopic ellipsometry.
12. Optical detection of melting point depression for silver nanoparticles via in situ real time spectroscopic ellipsometry.
13. Polarized light metrology for thin-film photovoltaics: research and development scale processes.
14. Dual rotating-compensator multichannel ellipsometer: Instrument development for high-speed Mueller matrix spectroscopy of surfaces and thin films.
15. Waveform analysis with optical multichannel detectors: Applications for rapid-scan spectroscopic ellipsometry.
16. Rotating-compensator multichannel ellipsometry: Applications for real time Stokes vector spectroscopy of thin film growth
17. Simultaneous real-time spectroscopic ellipsometry and reflectance for monitoring thin-film preparation.
18. Spectroscopic ellipsometry on the millisecond time scale for real-time investigations of thin-film and surface phenomena.
19. Optical transition energies as a probe of stress in polycrystalline CdTe thin films.
20. Analysis of interband, intraband, and plasmon polariton transitions in silver nanoparticle films via in situ real-time spectroscopic ellipsometry.
21. Broadening of optical transitions in polycrystalline CdS and CdTe thin films.
22. Electronic and structural properties of molybdenum thin films as determined by real-time spectroscopic ellipsometry.
23. Optical band gap of BiFeO3 grown by molecular-beam epitaxy.
24. Ultraviolet-extended real-time spectroscopic ellipsometry for characterization of phase evolution in BN thin films.
25. Surface, interface, and bulk properties of amorphous carbon films characterized by in situ ellipsometry.
26. In situ investigation of the nucleation of microcrystalline Si.
27. Multichannel ellipsometer for real time spectroscopy of thin film deposition from 1.5 to 6.5 eV.
28. Rotating-compensator multichannel ellipsometry for characterization of the evolution of nonuniformities in diamond thin-film growth.
29. Broadening of optical transitions in polycrystalline CdS and CdTe thin films
30. Optical functions of discontinuous aluminum films: Intraband and interband contributions to particle resonance absorption
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