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64 results on '"Hussam Amrouch"'

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1. Towards a New Thermal Monitoring Based Framework for Embedded CPS Device Security

2. Post-Silicon Heat-Source Identification and Machine-Learning-Based Thermal Modeling Using Infrared Thermal Imaging

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3. Minimizing Excess Timing Guard Banding Under Transistor Self-Heating Through Biasing at Zero-Temperature Coefficient

4. Weight-Oriented Approximation for Energy-Efficient Neural Network Inference Accelerators

5. NPU Thermal Management

6. Exposing Hardware Trojans in Embedded Platforms via Short-Term Aging

7. Dynamic Power and Energy Management for NCFET-Based Processors

8. A Cross-Layer Gate-Level-to-Application Co-Simulation for Design Space Exploration of Approximate Circuits in HEVC Video Encoders

9. On the Workload Dependence of Self-Heating in FinFET Circuits

10. MLCAD: A Survey of Research in Machine Learning for CAD Keynote Paper

11. Impact of Interface Traps on Negative Capacitance Transistor: Device and Circuit Reliability

12. On the Efficiency of Voltage Overscaling under Temperature and Aging Effects

13. Modeling and Evaluating the Gate Length Dependence of BTI

14. Estimating and Mitigating Aging Effects in Routing Network of FPGAs

15. Special Session: Machine Learning for Semiconductor Test and Reliability

16. Transistor Self-Heating: The Rising Challenge for Semiconductor Testing

17. Reliability-Driven Voltage Optimization for NCFET-based SRAM Memory Banks

18. On the Reliability of In-Memory Computing: Impact of Temperature on Ferroelectric TCAM

19. Soft Errors in Negative Capacitance FDSOI SRAMs

20. Robust Brain-Inspired Computing: On the Reliability of Spiking Neural Network Using Emerging Non-Volatile Synapses

21. Traps Based Reliability Barrier on Performance and Revealing Early Ageing in Negative Capacitance FET

22. Approximate Computing for ML

23. Cross-layer Design for Computing-in-Memory

24. Thermal Management and Communication Virtualization for Reliability Optimization in MPSoCs

25. Modeling emerging technologies using machine learning

26. Dynamic Guardband Selection: Thermal-Aware Optimization for Unreliable Multi-Core Systems

27. Impact of Extrinsic Variation Sources on the Device-to-Device Variation in Ferroelectric FET

28. Temperature Dependence and Temperature-Aware Sensing in Ferroelectric FET

29. BTI and HCD Degradation in a Complete 32 × 64 bit SRAM Array – including Sense Amplifiers and Write Drivers – under Processor Activity

30. Impact of Radiation on Negative Capacitance FinFET

31. Energy Optimization in NCFET-based Processors

32. Impact of NBTI Aging on Self-Heating in Nanowire FET

33. Aging-Aware Boosting

34. Recent advances in EM and BTI induced reliability modeling, analysis and optimization (invited)

35. Negative Capacitance Transistor to Address the Fundamental Limitations in Technology Scaling: Processor Performance

36. Reliability in Super- and Near-Threshold Computing: A Unified Model of RTN, BTI, and PV

37. Interdependencies of Degradation Effects and Their Impact on Computing

38. Power Side-Channel Attacks in Negative Capacitance Transistor (NCFET)

39. Machine Learning Based Online Full-Chip Heatmap Estimation

40. Performance, Power and Cooling Trade-Offs with NCFET-based Many-Cores

41. Hot Spot Identification and System Parameterized Thermal Modeling for Multi-Core Processors Through Infrared Thermal Imaging

42. Selecting the Optimal Energy Point in Near-Threshold Computing

43. Impact of NBTI on Increasing the Susceptibility of FinFET to Radiation

44. NCFET-Aware Voltage Scaling

45. Modeling the Interdependences between Voltage Fluctuation and BTI Aging

46. Estimating and optimizing BTI aging effects

47. Dynamic resource management for heterogeneous many-cores

48. Trading Off Temperature Guardbands via Adaptive Approximations

49. Voltage Adaptation Under Temperature Variation

50. Reliability Estimations of Large Circuits in Massively-Parallel GPU-SPICE