14 results on '"G Guégan"'
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2. Origin of hot carrier degradation in advanced nMOSFET devices.
3. Stress induced leakage current at low field in ultra thin oxides.
4. Static and low frequency noise characterization in surface- and buried-mode 0.1 μm PMOSFETS
5. Origin of hot carrier degradation in advanced nMOSFET devices
6. Thorough characterization of deep-submicron surface and buried channel pMOSFETs
7. Low temperature operation of ultra-thin gate oxide sub-0.1 μm MOSFETs
8. Static and low frequency noise characterization of surface- and buried-mode 0.1 μm P and N MOSFETs
9. Impact of gate tunneling leakage on the operation of NMOS transistors with ultra-thin gate oxides
10. Capacitance–Voltage (C–V) characterization of 20 Å thick gate oxide: parameter extraction and modeling
11. Low frequency noise characterization of 0.18μm Si CMOS transistors
12. Low frequency noise characterization of 0.25 μm Si CMOS transistors
13. Low frequency noise and random telegraph signals in 0.35μm silicon CMOS devices
14. Low-frequency noise and random telegraph signals in 0.35 μm silicon CMOS devices
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