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2. Parameter Extraction

4. Physics of Power Semiconductor Devices

5. Modeling of a Power Diode and IGBT

11. Modeling of MOS-side carrier injection in trench-gate IGBTs

12. Transient electrothermal simulation of power semiconductor devices

13. A fully integrated 660 MHz low-swing energy-recycling DC--DC converter

14. An analysis of high-power IGBT switching under cascade active voltage control

15. Comparison of submarine drive topologies using multiobjective genetic algorithms

16. Exploration of power device reliability using compact device models and fast electrothermal simulation

17. Modeling of IGBT resistive and inductive turn-on behavior

18. Physical modeling of fast p-i-n diodes with carrier lifetime zoning, Part I: device model

19. Physical modeling of fast p-i-n diodes with carrier lifetime zoning, Part II: parameter extraction

20. Application of centered differentiation and steepest descent to maximum power point tracking

21. The use of condition maps in the design and testing of power electronic circuits and devices

22. Simulation and optimization of diode and insulated gate bipolar transistor interaction in a chopper cell using MATLAB and Simulink

23. Regulation of photovoltaic voltage

24. Numerical optimization of an active voltage controller for high-power IGBT converters

26. Two-step parameter extraction procedure with formal optimization for physics-based circuit simulator IGBT and p-i-n diode models

27. Active voltage control of IGBTs for high power applications

28. Temperature effects on trench-gate punch-through IGBTs

29. Circuit simulator models for the diode and IGBT with full temperature dependent features

30. Characterization and modeling of high-voltage field-stop IGBTs

31. The series connection of IGBTs with active voltage sharing

32. Correlation between local segment characteristics and dynamic current redistribution in GTO power thyristors

39. Physics-based compact model of integrated gate-commutated thyristor with multiple effects for high-power application.

44. Investigation of the trade-off between switching losses and EMI generation in Gaussian S-shaping for high-power IGBT switching transients by active voltage control.

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