22 results on '"Chien, Wei-Ting Kary"'
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2. Exploration of baking temperature effects on 28 nm BEOL reliability
3. Early detection and prediction of HKMG SRAM HTOL performance by WLR PBTI tests
4. Influence of I/O oxide process on the NBTI performance of 28 nm HfO2-based HKMG p-MOSFETs
5. A cost-effective wafer-level reliability test system for integrated circuit makers
6. Practical 'Building-in Reliability' approaches for semiconductor manufacturing
7. Some practical concerns on isothermal electromigration tests
8. A nonparametric approach to estimate system burn-in time
9. Some practical considerations for effective and efficient wafer-level reliability control
10. Modeling & maximizing burn-in effectiveness
11. Improvement of poly-silicon hole induced gate oxide failure by silicon rich oxidation
12. An Extended Building-In Reliability Methodology on Evaluating SRAM Reliability by Wafer-Level Reliability Systems.
13. AdaBalGAN: An Improved Generative Adversarial Network With Imbalanced Learning for Wafer Defective Pattern Recognition.
14. Fast Semiconductor Reliability Assessments Using SPRT.
15. The Competing Aging Effects on SRAM Operating Life Tests.
16. Statistical Process Control for Monitoring the Particles With Excess Zero Counts in Semiconductor Manufacturing.
17. Electromigration Lifetime Optimization by Uniform Designs and a New Lifetime Index.
18. Reliability Baseline Management and Applications in Semiconductor Manufacturing.
19. Editorial: Reduce Time-to-Market by Considering Reliability Tradeoffs.
20. USING REVERSE ARRANGEMENT TEST TO DETECT NON-MONOTONIC TRENDS FOR SEMICONDUCTOR MANUFACTURING AND RELIABILITY TESTS.
21. A New Method to Determine the Reliability Comparability for Products, Components, and Systems in Reliability Testing.
22. A nonparametric Bayes approach to decide system burn-in time.
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