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The disorder‐to‐order (crystallization) process in phase‐change materials determines the speed and storage polymorphism of phase‐change memory devices. Only by clarifying the fine‐structure variation can the devices be insightfully designed, and encode and store information. As essential phase‐change parent materials, the crystallized Sb–Te binary system is generally considered to have the cationic/anionic site occupied by Sb/Te atoms. Here, direct atomic identification and simulation demonstrate that the ultrafast crystallization speed of Sb–Te materials is due to the random nature of lattice site occupation by different classes of atoms with the resulting octahedral motifs having high similarity to the amorphous state. It is further proved that after atomic ordering with disordered chemical occupation, chemical ordering takes place, which results in different storage states with different resistance values. These new insights into the complicated route from disorder to order will play an essential role in designing neuromorphic devices with varying polymorphisms. [ABSTRACT FROM AUTHOR]

Though phase-change materials (PCMs) are regarded as constituent part of next-generation phase-change memory and other unfolding optoelectronic applications, the kinetics study of glass transition and crystallization, significant property in switching remains obscure in high-temperature region. Hence, this paper reports the investigation of glass transition and crystallization kinetics of Te (1-x) (GeSe 0.5)Y x (TGSY) chalcogenide glass using differential scanning calorimetry (DSC) at heating rates 5, 10, 15, 20 °C/min. The effect of increasing Y quantity has been described by connecting structural relaxation kinematics during glass transition phenomena and devitrification while crystallization in chalcogenide glasses with their varied physicochemical characteristics. The inclusion of Y causes a discernible rise in the crystallization rate. The system is compatible with a strong glass-forming liquid, according to the Te (1-x) (GeSe 0.5) Y x material fragility index. According to the average values of the kinetic exponent factors, there is heterogeneous nucleation for the investigated composition, which is subsequently followed by a two- or three-dimensional crystal growth phenomenon. Different glass stability criteria have been discussed based on the relationship between the characteristic temperatures. The C ZW and C LX criteria were found to be inappropriate for discussing glass stability (GS) for the studied compositions based on the heating rate and composition dependencies of all criteria. The C YL criteria of Yuan et al. is the finest and it demonstrates the optimal ability for evaluating the GS, according to the data that was extracted from several GS criteria and their relative change parameters. By adding Y, thermal stability parameter and enthalpy emitted during the transition of glass and crystalline phases have been found to have an inverse relationship. All studied properties can conclude the application of studied material in phase-change material devices. [ABSTRACT FROM AUTHOR]

Superlattices made of alternating blocks of the phase change compound Sb 2 Te 3 and of TiTe 2 confining layers have been recently proposed for applications in neuromorphic devices. The Sb 2 Te 3 /TiTe 2 heterostructure allows for a better control of multiple intermediate resistance states and for a lower drift with time of the electrical resistance of the amorphous phase. However, Sb 2 Te 3 suffers from a low data retention due to a low crystallization temperature T x . Substituting Sb 2 Te 3 with a phase change compound with a higher T x , such as GeTe, seems an interesting option in this respect. Nanoconfinement might, however, alters the crystallization kinetics with respect to the bulk. In this work, we investigated the crystallization process of GeTe nanoconfined in geometries mimicking GeTe/TiTe 2 superlattices by means of molecular dynamics simulations with a machine learning potential. The simulations reveal that nanoconfinement induces a mild reduction in the crystal growth velocities which would not hinder the application of GeTe/TiTe 2 heterostructures in neuromorphic devices with superior data retention. [ABSTRACT FROM AUTHOR]

Though phase-change materials (PCMs) are regarded as constituent part of next-generation phase-change memory and other unfolding optoelectronic applications, the kinetics study of glass transition and crystallization, significant property in switching remains obscure in high-temperature region. Hence, this paper reports the investigation of glass transition and crystallization kinetics of Te (1-x) (GeSe 0.5)Y x (TGSY) chalcogenide glass using differential scanning calorimetry (DSC) at heating rates 5, 10, 15, 20 °C/min. The effect of increasing Y quantity has been described by connecting structural relaxation kinematics during glass transition phenomena and devitrification while crystallization in chalcogenide glasses with their varied physicochemical characteristics. The inclusion of Y causes a discernible rise in the crystallization rate. The system is compatible with a strong glass-forming liquid, according to the Te (1-x) (GeSe 0.5) Y x material fragility index. According to the average values of the kinetic exponent factors, there is heterogeneous nucleation for the investigated composition, which is subsequently followed by a two- or three-dimensional crystal growth phenomenon. Different glass stability criteria have been discussed based on the relationship between the characteristic temperatures. The C ZW and C LX criteria were found to be inappropriate for discussing glass stability (GS) for the studied compositions based on the heating rate and composition dependencies of all criteria. The C YL criteria of Yuan et al. is the finest and it demonstrates the optimal ability for evaluating the GS, according to the data that was extracted from several GS criteria and their relative change parameters. By adding Y, thermal stability parameter and enthalpy emitted during the transition of glass and crystalline phases have been found to have an inverse relationship. All studied properties can conclude the application of studied material in phase-change material devices. [ABSTRACT FROM AUTHOR]

The magnetostructural phase transition in Fe50Al50 alloy with chemically ordered paramagnetic B2 and disordered ferromagnetic (FM) A2 phase has applications in spintronics such as phase-change magnetic memory and magnonic devices. We first conducted a systematic first-principles density functional theory study of the A2 and B2 phases in the Fe50Al50 alloy. A theoretical understanding of this equiatomic alloy's electronic and spin-dynamical properties leads us to the experimental exploration of the FM A2 phase. Therefore, we deposit the 50 nm Fe50Al50 alloy thin film using sputtering and investigate the influence of the Ta buffer layer on its structural and magnetic properties. Our results reveal that the film with a buffer layer exhibits the A2 phase with appreciably higher saturation magnetization (848 emu/cc) than the film without a buffer layer (576 emu/cc). However, the surface roughness and Gilbert damping (α) slightly increase with the presence of the buffer layer from 0.41 to 0.56 nm and 4.35 × 10−3–4.94 × 10−3, respectively. The enhancement in α is due to extrinsic contributions induced by surface inhomogeneities. [ABSTRACT FROM AUTHOR]

Thermal stability and phase transition rate are two important issues that restrict the engineering applications of phase change memories. In this paper, GeSb/Sb multilayer films were prepared by multilayer stacking, and their phase transition properties were investigated. GeSb/Sb multilayer films had higher crystallization temperature, better data retention, and lower resistance drift than pure Sb films, which indicated that they had excellent thermal stability and accuracy of resistance identification. The test results of X‐ray diffraction and atomic force microscopy showed that GeSb spacer layers could inhibit grain growth of Sb film layers, thus reducing the roughness and potential fluctuation of the film surface. X‐ray reflectivity experiments showed that the GeSb/Sb multilayer films before and after crystallization had small volume changes. The devices based on [GeSb(7 nm)/Sb(3 nm)]8 multilayer films could achieve reversible resistive transition operation between SET and RESET at a pulse width of 10 ns, showing satisfactory transition rate and operational power consumption. The low resistance drift and ultra‐fast phase transition speed make GeSb/Sb multilayer films one of the promising choices for phase change memories. [ABSTRACT FROM AUTHOR]

Non-volatile memory, which can simultaneously store data and compute in memory, is a promising candidate to break through "memory bottleneck". However, its operation speed and thermal stability are still contradictory and difficult to meet the requirement of in-memory computing especially in high-temperature applications. In this work, optoelectronic hybrid phase-change memory based on Cr doped Ge 2 Sb 2 Te 5 material is proposed, where the picosecond laser is used to perform the information recording/erasing operation based on the reversible phase-change characteristics while resistance signal is detected to realize the information readout. Results imply that the Cr doped Ge 2 Sb 2 Te 5 film with Cr concentration of 10.7 at. % has high crystallization temperature (289 °C) and ten-year data-retention temperature (221 °C), low density-change rate (2.3%) and small resistance drift coefficients (0.022 at 85 °C, 0.056 at 120 °C, 0.070 at 150 °C, and 0.00131 for the laser induced SET state). The corresponding memory device has the SET/RESET operation speeds of as fast as 1820 ps/13 ps accompanied by the RESET/SET resistance ratio of higher than two orders of magnitude. The structural analyses indicate that Cr doping can suppress the growth of grains and reduce the grain size, improving the thermal stability of amorphous Ge 2 Sb 2 Te 5 thin film while the octahedral/defective octahedral motif ensures its fast phase-change speed. Therefore, Cr doped Ge 2 Sb 2 Te 5 based optoelectronic hybrid phase-change memory with superior thermal stability and ultrafast operation speed may be one of the promising solutions for in-memory computing. [ABSTRACT FROM AUTHOR]

The doping with Cu in the Sb-Se material system can effectively reduce power consumption and improve data retention ability of the PCRAM (Phase-Change Random-Access Memory) material. However, no thermodynamic study of the Cu-Sb-Se system has been reported. Therefore, in this work the Cu-Sb-Se system was modeled using the CALPHAD (CALculation of PHAse Diagrams) method. The excess Gibbs energies of solution phases, including liquid and FCC were expressed by the Redlich-Kister polynomial. Two-sublattice model (Cu,Se)2Se was used to describe the solid solution of binary intermetallic compounds, i.e. α-Cu2Se and β-Cu2Se in Cu-Sb-Se ternary system. The compounds, e.g. η(Cu2Sb), β(Cu3Sb), Sb2Se3, α-CuSe, β-CuSe, Pe(Cu3SbSe4) and C(CuSb3Se5) were described as stoichiometric compounds. The temperature of the eutectic reaction γ(Cu17Sb3) = (Cu) + δ(Cu4Sb) in the Cu-Sb system and the temperature of the invariant reaction L1 = L2 + (Sb) in the Sb-Se system were adjusted. A set of self-consistent thermodynamic parameters for the Cu-Sb-Se system was obtained, and the 623, 673, 723, 773, 873 and 973 K isothermal sections, and the liquidus projection and invariant reactions for this ternary system have been calculated. [ABSTRACT FROM AUTHOR]

Phase-change memory (PCM), recently developed as the storage-class memory in a computer system, is a new non-volatile memory technology. In addition, the applications of PCM in a non-von Neumann computing, such as neuromorphic computing and in-memory computing, are being investigated. Although PCM-based devices have been extensively studied, several concerns regarding the electrical, thermal, and structural dynamics of phase-change devices remain. In this article, aiming at PCM devices, a comprehensive review of PCM materials is provided, including the primary PCM device mechanics that underpin read and write operations, physics-based modeling initiatives and experimental characterization of the many features examined in nanoscale PCM devices. Finally, this review will propose a prognosis on a few unsolved challenges and highlight research areas of further investigation. We certify that the submitted manuscript is truly original, unpublished, and not being considered for publication elsewhere. [ABSTRACT FROM AUTHOR]

The concept of metric dimension has many applications, including optimizing sensor placement in networks and identifying influential persons in social networks, which aids in effective resource allocation and focused interventions; finding the source of a spread in an arrangement; canonically labeling graphs; and inserting typical information in low-dimensional Euclidean spaces. In a graph G, the set S⊆V(G) of minimum vertices from which all other verticescan be uniquely determined by the distances to the vertices in S is called the resolving set. The cardinality of the resolving set is called the metric dimension. The set S is called fault-tolerant resolving set if S\{v} is still a resolving set of G. The minimum cardinality of such a set S is called fault-tolerant metric dimension of G. GeSbTe super lattice is the latest chemical compound to have electronic material that is capable of non-volatile storing phase change memories with minimum energy usage. In this work, we calculate the resolving set (fault tolerant resolving set) to find the metric dimension(fault-tolerant metric dimension) for the molecular structure of the GeSbTe lattice. The results may be useful in comparing network structure and categorizing the structure of the GeSbTe lattice. [ABSTRACT FROM AUTHOR]

Reversible switching of room‐temperature electrical resistivity due to crystal‐amorphous transition is demonstrated in various chalcogenides for development of non‐volatile phase change memory. However, such reversible thermal switching of room‐temperature electrical resistivity has not reported in transition metal oxides so far, despite their enormous studies on the electrical conduction like metal‐insulator transition and colossal magnetoresistance effect. In this study, a thermally reversible switching of room‐temperature electrical resistivity is reported with gigantic variation in a layered nickelate Sr2.5Bi0.5NiO5 (1201‐SBNO) composed of (Sr1.5Bi0.5)O2 rock‐salt and SrNiO3 perovskite layers via unique crystalline phase changes between the conducting 1201‐SBNO with ordered (O‐1201), disordered Sr/Bi arrangements in the (Sr1.5Bi0.5)O2 layer (D‐1201), and insulating oxygen‐deficient double perovskite Sr2BiNiO4.5 (d‐perovskite). The O‐1201 is reentrant by high‐temperature annealing of ≈1000 °C through crystalline phase change into the D‐1201 and d‐perovskite, resulting in the thermally reversible switching of room‐temperature electrical resistivity with 102‐ and 109‐fold variation, respectively. The 1201‐SBNO is the first oxide to show the thermally reversible switching of room‐temperature electrical resistivity via the crystalline phase changes, providing a new perspective on the electrical conduction for transition metal oxides. [ABSTRACT FROM AUTHOR]

In order to suppress the crosstalk and provide a high on-current to melt the incorporated phase change materials in the PCRAM array and 3D stacking chips, the authors [[8]] investigated the influence of Si concentration on the electrical properties of the Si-Te ovonic threshold selector. 36986003 3 Wang K., He Q., Yang D., Pi X. Highly Efficient Energy Transfer from Silicon to Erbium in Erbium-Hyperdoped Silicon Quantum Dots. 10.3390/nano13010121 2 Sun T., Li D., Chen J., Wang Y., Han J., Zhu T., Li W., Xu J., Chen K. Enhanced Electroluminescence from a Silicon Nanocrystal/Silicon Carbide Multilayer Light-Emitting Diode. [Extracted from the article]

Phase‐change random‐access memory (PCRAM) devices suffer from pronounced resistance drift originating from considerable structural relaxation of phase‐change materials (PCMs), which hinders current developments of high‐capacity memory and high‐parallelism computing that both need reliable multibit programming. This work realizes that compositional simplification and geometrical miniaturization of traditional GeSbTe‐like PCMs are feasible routes to suppress relaxation. While to date, the aging mechanisms of the simplest PCM, Sb, at nanoscale, have not yet been unveiled. Here, this work demonstrates that in an optimal thickness of only 4 nm, the thin Sb film can enable a precise multilevel programming with ultralow resistance drift coefficients, in a regime of ≈10−4–10−3. This advancement is mainly owed to the slightly changed Peierls distortion in Sb and the less‐distorted octahedral‐like atomic configurations across the Sb/SiO2 interfaces. This work highlights a new indispensable approach, interfacial regulation of nanoscale PCMs, for pursuing ultimately reliable resistance control in aggressively‐miniaturized PCRAM devices, to boost the storage and computing efficiencies substantially. [ABSTRACT FROM AUTHOR]

[Display omitted] Interfacial Phase Change Memory (iPCM) retrench unnecessary power consumption due to wasted heat generated during phase change by reducing unnecessary entropic loss. In this study, an advanced iPCM (GeTe/Ti-Sb 2 Te 3 Superlattice) is synthesized by doping Ti into Sb 2 Te 3. Structural analysis and density functional theory (DFT) calculations confirm that bonding distortion and structurally well-confined layers contribute to improve phase change properties in iPCM. Ti-Sb 2 Te 3 acts as an effective thermal barrier to localize the generated heat inside active region, which leads to reduction of switching energy. Since Ge-Te bonds adjacent to short and strong Ti-Te bonds are more elongated than the bonds near Sb-Te, it is easier for Ge atoms to break the bond with Te due to strengthened Peierls distortions (R long /R short) during phase change process. Properties of advanced iPCM (cycling endurance, write speed/energy) exceed previous records. Moreover, well-confined multi-level states are obtained with advanced iPCM, showing potential as a neuromorphic memory. Our work paves the way for designing superlattice based PCM by controlling confinement layers. [ABSTRACT FROM AUTHOR]

In order to validate the flexible storage potential, [Ge 2 Sb 2 Te 5 (3 nm)/Sb(7 nm)] 5 superlattice-like phase change films on flexible polyetheretherketone substrates were prepared by magnetron sputtering. The phase transition behavior and the effect of different bending cycles on the properties were investigated. Compared with conventional rigid Si/SiO 2 substrate, [Ge 2 Sb 2 Te 5 (3 nm)/Sb(7 nm)] 5 films based on a flexible substrate possessed better thermal stability and surface adhesion. The superlattice-like structure was confirmed by transmission electron microscopy. PCM devices based on polyetheretherketone substrates were fabricated and the electrical conversion characteristics before and after bending were verified and compared. [ABSTRACT FROM AUTHOR]

We discuss inline electrical testing to monitor the baseline of Analog Computing hardware using Phase Change Memory (PCM) technology. Tightening the PCM resistance distribution is necessary to meet analog computation requirement. A new yield methodology is introduced. A study of heater process variation, which will affect the heater height and the PCM resistance, will be discussed. [ABSTRACT FROM AUTHOR]

Metavalent bonding (MVB) is characterized by the competition between electron delocalization as in metallic bonding and electron localization as in covalent or ionic bonding, serving as an essential ingredient in phase‐change materials for advanced memory applications. The crystalline phase‐change materials exhibits MVB, which stems from the highly aligned p orbitals and results in large dielectric constants. Breaking the alignment of these chemical bonds leads to a drastic reduction in dielectric constants. In this work, it is clarified how MVB develops across the so‐called van der Waals‐like gaps in layered Sb2Te3 and Ge–Sb–Te alloys, where coupling of p orbitals is significantly reduced. A type of extended defect involving such gaps in thin films of trigonal Sb2Te3 is identified by atomic imaging experiments and ab initio simulations. It is shown that this defect has an impact on the structural and optical properties, which is consistent with the presence of non‐negligible electron sharing in the gaps. Furthermore, the degree of MVB across the gaps is tailored by applying uniaxial strain, which results in a large variation of dielectric function and reflectivity in the trigonal phase. At last, design strategies are provided for applications utilizing the trigonal phase. [ABSTRACT FROM AUTHOR]

The selector is an indispensable section of the phase change memory (PCM) chip, where it not only suppresses the crosstalk, but also provides high on-current to melt the incorporated phase change material. In fact, the ovonic threshold switching (OTS) selector is utilized in 3D stacking PCM chips by virtue of its high scalability and driving capability. In this paper, the influence of Si concentration on the electrical properties of Si-Te OTS materials is studied; the threshold voltage and leakage current remain basically unchanged with the decrease in electrode diameter. Meanwhile, the on-current density (Jon) increases significantly as the device is scaling down, and 25 MA/cm2 on-current density is achieved in the 60-nm SiTe device. In addition, we also determine the state of the Si-Te OTS layer and preliminarily obtain the approximate band structure, from which we infer that the conduction mechanism conforms to the Poole-Frenkel (PF) model. [ABSTRACT FROM AUTHOR]

High density phase change memory array requires both minimized critical dimension (CD) and maximized process window for the phase change material layer. High in-wafer uniformity of the nanoscale patterning of chalcogenides material is challenging given the optical proximity effect (OPE) in the lithography process and the micro-loading effect in the etching process. In this study, we demonstrate an approach to fabricate high density phase change material arrays with half-pitch down to around 70 nm by the co-optimization of lithography and plasma etching process. The focused-energy matrix was performed to improve the pattern process window of phase change material on a 12-inch wafer. A variety of patternings from an isolated line to a dense pitch line were investigated using immersion lithography system. The collapse of the edge line is observed due to the OPE induced shrinkage in linewidth, which is deteriorative as the patterning density increases. The sub-resolution assist feature (SRAF) was placed to increase the width of the lines at both edges of each patterning by taking advantage of the optical interference between the main features and the assistant features. The survival of the line at the edges is confirmed with around a 70 nm half-pitch feature in various arrays. A uniform etching profile across the pitch line pattern of phase change material was demonstrated in which the micro-loading effect and the plasma etching damage were significantly suppressed by co-optimizing the etching parameters. The results pave the way to achieve high density device arrays with improved uniformity and reliability for mass storage applications. [ABSTRACT FROM AUTHOR]

We designed the phase-change memory (PCM) cell based on ultrathin GeTe film (∼10 nm) and homemade nanoscale electrode filling craft to improve data retention ability and reduce programming energy, respectively. It was found that the temperature for ten years' data retention of this ultrathin GeTe film is 160 ± 32.8 °C, which is much higher than that of conventional Ge2Sb2Te5 (GST, 83 ± 20.6 °C) film. Benefit to the nature of fragile-to-strong crossover behavior in GeTe supercooled liquids that was confined in a two-dimension structure, a fast SET speed of 6 ns is also detected in this ultrathin GeTe PCM. Moreover, the RESET power consumption of this ultrathin GeTe PCM is measured as 1.8 ± 0.5 nJ, and it is much lower than that of GST PCM (16.5 ± 1.5 nJ), which is attributed to the nanoscale electrode of the devices. The above-mentioned improvements enable the application of ultrathin GeTe PCM in neuromorphic computing. [ABSTRACT FROM AUTHOR]

As a new generation of non-volatile memory, phase change random access memory (PCRAM) has the potential to fill the hierarchical gap between DRAM and NAND FLASH in computer storage. Sb2Te3, one of the candidate materials for high-speed PCRAM, has high crystallization speed and poor thermal stability. In this work, we investigated the effect of carbon doping on Sb2Te3. It was found that the FCC phase of C-doped Sb2Te3 appeared at 200 °C and began to transform into the HEX phase at 25 °C, which is different from the previous reports where no FCC phase was observed in C-Sb2Te3. Based on the experimental observation and first-principles density functional theory calculation, it is found that the formation energy of FCC-Sb2Te3 structure decreases gradually with the increase in C doping concentration. Moreover, doped C atoms tend to form C molecular clusters in sp2 hybridization at the grain boundary of Sb2Te3, which is similar to the layered structure of graphite. And after doping C atoms, the thermal stability of Sb2Te3 is improved. We have fabricated the PCRAM device cell array of a C-Sb2Te3 alloy, which has an operating speed of 5 ns, a high thermal stability (10-year data retention temperature 138.1 °C), a low device power consumption (0.57 pJ), a continuously adjustable resistance value, and a very low resistance drift coefficient. [ABSTRACT FROM AUTHOR]

Phase change memory (PCM), a typical representative of new storage technologies, offers significant advantages in terms of capacity and endurance. However, among the research on phase change materials, thermal stability and switching speed performance have always been the direction where breakthroughs are needed. In this research, as a high-speed and good thermal stability material, Ta was proposed to be doped in Sb3Te1 alloy to improve the phase transition performance and electrical properties. The characterization shows that Ta-doped Sb3Te1 can crystallize at temperatures up to 232 °C and devices can operate at speeds of 6 ns and 8 × 104 operation cycles. The reduction of grain size and the density change rate (3.39%) show excellent performances, which are both smaller than that of Ge2Sb2Te5 (GST) and Sb3Te1. These properties conclusively demonstrate that Ta incorporation of Sb3Te1 alloy is a material with better thermal stability and faster crystallization rates for PCM applications. [ABSTRACT FROM AUTHOR]

Phase‐change semiconductor is one of the best candidates for designing nonvolatile memory, but it has never been realized in organic semiconductors until now. Here, a phase‐changeable and high‐mobility organic semiconductor (3,6‐DATT) is first synthesized. Benefiting from the introduction of electrostatic hydrogen bond (S···H), the molecular conformation of 3,6‐DATT crystals can be reversibly modulated by the electric field and ultraviolet irradiation. Through experimental and theoretical verification, the tiny difference in molecular conformation leads to crystalline polymorphisms and dramatically distinct charge transport properties, based on which a high‐performance organic phase‐change memory transistor (OPCMT) is constructed. The OPCMT exhibits a quick programming/erasing rate (about 3 s), long retention time (more than 2 h), and large memory window (i.e., large threshold voltage shift over 30 V). This work presents a new molecule design concept for organic semiconductors with reversible molecular conformation transition and opens a novel avenue for memory devices and other functional applications. [ABSTRACT FROM AUTHOR]

Phase-change random-access memory (PCRAM) holds great promise for next-generation information storage applications. As a mature phase change material, Ge2Sb2Te5 alloy (GST) relies on the distinct electrical properties of different states to achieve information storage, but there are relatively few studies on the relationship between electron transport and microstructure. In this work, we found that the first resistance dropping in GST film is related to the increase of carrier concentration, in which the atomic bonding environment changes substantially during the crystallization process. The second resistance dropping is related to the increase of carrier mobility. Besides, during the cubic to the hexagonal phase transition, the nanograins grow significantly from ~50 nm to ~300 nm, which reduces the carrier scattering effect. Our study lays the foundation for precisely controlling the storage states of GST-based PCRAM devices. [ABSTRACT FROM AUTHOR]

The article discusses challenges and strategies for producing transmission electron microscopy (TEM)-compatible and electronically viable electronic devices. Topics include the sample preparation process using the Focused ion beam (FIB) technique to create cross-sectioned samples; and highlights the potential of scanning TEM electron beam-induced current as a complement to standard TEM imaging with benefits of high-throughput sample fabrication.

Always-on TinyML perception tasks in Internet of Things applications require very high energy efficiency. Analog compute-in-memory (CiM) using nonvolatile memory (NVM) promises high energy efficiency and self-contained on-chip model storage. However, analog CiM introduces new practical challenges, including conductance drift, read/write noise, fixed analog-to-digital (ADC) converter gain, etc. These must be addressed to achieve models that can be deployed on analog CiM with acceptable accuracy loss. This article describes AnalogNets: TinyML models for the popular always-on tasks of keyword spotting (KWS) and visual wake word (VWW). The model architectures are specifically designed for analog CiM, and we detail a comprehensive training methodology, to retain accuracy in the face of analog nonidealities, and low-precision data converters at inference time. We also describe AON-CiM, a programmable, minimal-area phase-change memory (PCM) analog CiM accelerator, with a layer-serial approach to remove the cost of complex interconnects associated with a fully pipelined design. We evaluate the AnalogNets on a calibrated simulator, as well as real hardware, and find that accuracy degradation is limited to 0.8%/1.2% after 24 h of PCM drift (8 bits) for KWS/VWW. AnalogNets running on the 14-nm AON-CiM accelerator demonstrate 8.55/26.55/56.67 and 4.34/12.64/25.2 TOPS/W for KWS and VWWs with 8-/6-/4-bit activations, respectively. [ABSTRACT FROM AUTHOR]

In our data world, a host of not necessarily trusted controllers gather data on individual subjects. To preserve her privacy and, more generally, her informational self-determination, the individual has to be empowered by giving her agency on her own data. Maximum agency is afforded by local anonymization, that allows each individual to anonymize her own data before handing them to the data controller. Randomized response (RR) is a local anonymization approach able to yield multi-dimensional full sets of anonymized microdata that are valid for exploratory analysis and machine learning. This is so because an unbiased estimate of the distribution of the true data of individuals can be obtained from their pooled randomized data. Furthermore, RR offers rigorous privacy guarantees. The main weakness of RR is the curse of dimensionality when applied to several attributes: as the number of attributes grows, the accuracy of the estimated true data distribution quickly degrades. We propose several complementary approaches to mitigate the dimensionality problem. First, we present two basic protocols, separate RR on each attribute and joint RR for all attributes, and discuss their limitations. Then we introduce an algorithm to form clusters of attributes so that attributes in different clusters can be viewed as independent and joint RR can be performed within each cluster. After that, we introduce an adjustment algorithm for the randomized data set that repairs some of the accuracy loss due to assuming independence between attributes when using RR separately on each attribute or due to assuming independence between clusters in cluster-wise RR. We also present empirical work to illustrate the proposed methods. [ABSTRACT FROM AUTHOR]

PCM (phase-change memory) is a memory innovation that has gained prominence as a capacity-class memory for computer systems. It is made up of a tiny functional amount of phase-change material that is located in the middle of two electrodes. In PCM, data is kept by utilizing the difference in electrical resistance between a crystalline phase, which has a high resistance, and its amorphous phase, which has a low resistance. Using electrical pulses, the phase-change material would be shifted from a high to the low conductive region and conversely. However, the device's material science concerned with PCM has been generally studied, and questions remain regarding their electrical, warm, and fundamental aspects since its publication in the 1960s. One major downside of PCM is its low heat conductivity, which causes delays in the energy charging/discharging procedure and hardware efficiency. As a result of this, one of the primary focuses of PCM studies has been the improvement of PCM's heat conductivity through the utilization of nanotechnology and nanomaterials. Nanotechnology has been developing ultrasmall nanoparticles to improve traditional PCMs' thermophysical characteristics. These nanomaterials, such as metal, metal oxide, and carbon, will significantly boost PCM's thermal properties, including supercooling, viscosity, and heat capacity. An overview of PCM devices is presented in this article, which underlies perusing and composition activities. Consequently, we offered novel PCM devices and materials. Therefore, the total study is qualitative, and no machine learning approach is used. Because of this, we cannot say that the data is quantitative. Our work includes both test representations of the specific features observed in nanoscale PCM devices and material science demonstrations. In the end, we provide a point of view on some remaining open inquiries and possible future exploration directions. [ABSTRACT FROM AUTHOR]

Nonvolatile phase‐change random access memory (PCRAM) is regarded as one of the promising candidates for emerging mass storage in the era of Big Data. However, relatively high programming energy hurdles the further reduction of power consumption in PCRAM. Utilizing narrow edge‐contact of graphene can effectively reduce the active volume of phase change material in each cell, and therefore realize low‐power operation. Here, it demonstrates that the power consumption can be reduced to ≈53.7 fJ in a cell with ≈3 nm‐wide graphene nanoribbon (GNR) as edge‐contact, whose cross‐sectional area is only ≈1 nm2. It is found that the polarity of the bias pulse determines its cycle endurance in the asymmetric structure. If a positive bias is applied to the graphene electrode, the endurance can be extended at least one order longer than the case with a reversal of polarity. In addition, the introduction of the hexagonal boron nitride (h‐BN) multilayer leads to a low resistance drift and a high programming speed in a memory cell. The work represents a great technological advance for the low‐power PCRAM and can benefit in‐memory computing in the future. [ABSTRACT FROM AUTHOR]

Emerging Non-Volatile memories such as Phase Change Memory (PCM) and Resistive RAM are projected as potential replacements of the traditional DRAM-based main memories. However, limited write endurance and high write energy limit their chances of adoption as a mainstream main memory standard. Therefore, developing solutions that enhance the lifetime of these memories while offering a decent system performance has a great impact in building future large capacity and energy-efficient main memories. In this paper, we propose a word-level compression scheme called COMF to reduce bitflips in PCMs by removing the most repeated words from the cache blocks before writing into memory. COMF is augmented with an adaptive granularity-based encoding technique to form COFAE, which reduces the bitflips to a further extent. We also propose SWEL-COFAE, an intra-line stride-based wear leveling technique to improve lifetime by balancing the bitflip pressure within the cells of the memory lines. Experimental results show that the proposed technique improves lifetime by 101% and reduces bitflips and energy by 59% and 61% respectively over baseline. [ABSTRACT FROM AUTHOR]

Sb-rich GeSbTe-based phase-change memories (PCMs) were studied in the past years for their high switching speed to target storage class memory (SCM) applications. In this work, we show the advantages of an engineered multilayered Sb-rich GeSbTe stack compared with standard bulk reference materials. The studied multilayer-based PCM devices feature a lower programming current with respect to the equivalent bulk ones, preserving a high programming speed. Furthermore, multilayered Sb-rich GeSbTe brings better endurance performances for a wide programming current range and extremely reduced cycle-to-cycle (C2C) and device-to-device (D2D) variability along cycling verified in 4 kb PCM arrays. These results confirm improved yield and reliability obtained, thanks to multilayered PCM solution. [ABSTRACT FROM AUTHOR]

Previous research on phase change memory (PCM) devices shows that correct modeling of the RESET melting process requires including the Gibbs–Thomson melting temperature for the solid–liquid interface. This additional physical effect results in substantially different predicted scaling properties and melting behavior than shown in previous research on conventional PCM devices scaled to nanometer dimensions. The computations also reveal that the thermodynamic Gibbs–Thomson effect gives rise to two steady state classes of liquid pools over a range of applied voltages. At any given voltage both states appear. This research characterizes these two classes of pool shapes by analyzing the linear stability of each pool shape class to elucidate the time-dependent, dynamic properties of the liquid pools. The stability analysis uses a novel numerical approach, required due to the large thermal and potential gradients within the system and the lack of geometrical symmetry of the steady base states. Results of the analysis show that at all given applied voltages, the smaller liquid pool shape class is linearly unstable and the larger pool shape class is linearly stable. The stability characteristics of the classes of liquid pools justify the designation of the nucleus state for the smaller liquid pool and the melting limit state for the larger liquid pool. The results imply that a system with a liquid pool larger than the nucleus state will eventually grow to the melting limit state which is a stable fixed point. Comparison with a spherically symmetric PCM model system reveals that in the isothermal limit the nucleus state exhibits precisely classical nucleation behavior found for a thermodynamically unstable critical nucleus. The theory used to identify the class of critical nuclei steady state shapes in this analysis is also novel, because it avoids the need to identify the extremum of a thermodynamic potential that is used in most treatments that attempt to identify the initial formation of new phases in inhomogeneous, evolving systems. [Display omitted] • Analysis of melting during the phase change memory RESET process. • Discovery of two classes of steady states of the RESET melting process. • One nucleus-like state and another state representing the final melted state. • Linear stability analysis performed on steady states. • Nucleus-like state is unstable and melting limit state is stable. [ABSTRACT FROM AUTHOR]

Multi-level phase-change (MLPC) memory can not only further raise the storage density of high-density phase-change memory, but also have significant applications in neuromorphic computing. However, acquisitions of MLPC materials are very challenging. MLPC is only observed in a small number of phase-change materials and can't be designed determinately because the mechanism of MLPC emergence has been understood incompletely. Here, we investigate phase-change behaviors of six Ge 2 Sb 2 Te 5 (x nm)/Sb 7 Se 3 (60-x nm) bilayer films with x = 5, 10, 15, 20, 35, and 50. Three-level phase-change memory is observed for five bilayer films with x < 50, but not for one with x = 50, revealing the dependence of MLPC memory on the thickness ratio of two constituent layers composing bilayer films. A parallel resistance model is proposed to describe the measured sheet resistance of bilayer films and can be used to explain the thickness-ratio dependence of three-level phase-change memory very well. Subsequently, a design rule for MLPC memory films is given out unambiguously. Based on the parallel resistance model, MLPC memories are simulated for bilayer and trilayer films. Three-level memory indeed appears in bilayer films only when the design rule is met, confirming the validity of our design rule. Four-level memory is predicted in trilayer films as the design rule is obeyed. [Display omitted] • Multi-level phase-change behaviors of six bilayer phase-change films, Ge 2 Sb 2 Te 5 (x nm)/Sb 7 Se 3 (60-x nm) with x = 5, 10, 15, 20, 35 and 50, were studied by the measurement of sheet resistance as a function of heating temperature. • Appearance of three-level phase-change behaviors depended on the thickness ratio of Ge 2 Sb 2 Te 5 and Sb 7 Se 3 layers. Similar phenomena were reported previously in the literatures, but not understood and explained. • A parallel resistance model was proposed to describe the sheet resistance of bilayer films. Based on the model, the thickness-ratio dependence of three-level phase-change behaviors could be explained very well. • A design rule of multi-level phase-change multi-layer films was given out for the first time. Multi-level phase changes were simulated for bilayer films based on the sheet resistance model. It was found that three-level phase changes indeed emerged only when our design rule was met totally, conforming the validity of our design rule. Furthermore, a scheme of trilayer films was proposed. Its multi-level phase changes were simulated. Four-level phase changes were predicted only if the design rule was obeyed totally. • Multi-level phase-change films could be designed determinately under the guidance of the design rule, no longer be encountered and observed accidentally. Our results pave the way for determinate design of desired multi-level phase-change films. [ABSTRACT FROM AUTHOR]

Phase change memory (PCM) is an exceptional universal memory innovation that offers qualities like fast speed and non-volatility. But major obstacle still exists in achieving better thermal stability and rapid switching at the same time. Therefore, it is crucial to investigate new materials with enhanced properties. To overcome the contrast of access time between storage systems and memories, storage class memory concept based on emerging nonvolatile memory technology has been introduced. Resistive switching has gained much awareness in last decade due to its application in PCM technologies. Investigation of resistive switching on novel Te (1−x) (GeSe 0.5)Sc x (x = 0, 0.05, 0.1, 0.15) quaternary alloy has been analyzed in this paper. Material has revealed electrical resistivity contrast of ∼103 orders of magnitude that offers better thermal stability than the majority of other phase transition alloys. Additionally, current-voltage (I-V) properties and voltage dependent threshold switching support an incredibly fast threshold switching operation. Switching is observed at 18–30 V and threshold voltage has been noticed to decrease (10–12 V) with increasing temperature. From XPS study, it can be observed that binding energy is shifting towards lower energies by 0.25 eV. Sc makes the GeTeSe parent material appealing for next-generation high-speed, non-volatile, and improved thermal stability memory applications. [Display omitted] • Electrical resistivity contrast of ∼103 orders of magnitude. • Better thermal stability than the majority of other phase transition alloys. • Switching is observed at 18-30 V and threshold voltage has been noticed to decrease (10-12 V) with increasing temperature. • The barrier-cluster model is used to interpret compensating effect in thermally controlled resistive switching and d.c. conduction. • Sc makes the GeTeSe appealing for next-generation high-speed, non-volatilememory applications. [ABSTRACT FROM AUTHOR]

Smart devices for structural health monitoring provide edge computing capabilities to reduce wireless transmission and, thus, power consumption. Although effective algorithms have been proposed in the last few decades, traditional microcontrollers require heavy data flow between the memory and the central processing unit that involves a considerable fraction of the total energy consumption. Phase change memory has recently emerged as an attractive solution in the field of resistive nonvolatile memory for analog in-memory computing, which is a valid approach to avoid data being conveyed among distinct elaboration units. However, it has never been envisaged in structural health monitoring applications. As this technology is still in an embryonic state, several challenges related to nonlinearities and nonidealities of the memory elements and the energy expenditure related to the memory reprogramming process may undermine its usage. In this paper, the application of a novel identification approach for civil infrastructures is investigated using phase change memories. The main computational core of the presented algorithm, consisting of one-dimensional convolutions, is particularly suitable for implementations involving analog in-memory computing, thus showing the great potential of this technology for structural health monitoring applications. The test unit is an embedded phase change memory provided by STMicroelectronics and designed in 90-nm smart power bipolar complementary metal-oxide-semiconductor (CMOS)-double-diffused metal-oxide-semiconductor (DMOS) technology with a Ge-rich Ge-Sb-Te alloy for automotive applications. Experimental results obtained for a viaduct of an Italian motorway support the efficacy of the method. Moreover, the influence of nonidealities on the outcomes of damage identification based on both dynamic and quasi-static structural parameters is examined. [ABSTRACT FROM AUTHOR]

The article looks at a study which show how the intrinsic properties of metal-oxide volatile mersisters emulate the processes supporting biological palimpsest consolidation. It mentions synapses exhibit an expanded doubled capacity and protect a consolidated memory while up to hundreds of uncorrelated short-term memories temporarily overwrite it, without requiring specialized instructions. It also mentions embedded artificial intelligence can greatly benefit from this functionality.

The article presents a study which explores the polarization-selective reconfigurability in hybridized-active-dielectric nanowires. It mentions that wavelength and polarization are two fundamental properties of light within which information can be encoded and (de)multiplexed. It demonstrate the ability to use polarization as a parameter to selectively modulate the conductance of individual nanowires within a multi-nanowire system.

Phase change memory (PCM), due to the advantages in capacity and endurance, has the opportunity to become the next generation of general−purpose memory. However, operation speed and data retention are still bottlenecks for PCM development. The most direct way to solve this problem is to find a material with high speed and good thermal stability. In this paper, platinum doping is proposed to improve performance. The 10-year data retention temperature of the doped material is up to 104 °C; the device achieves an operation speed of 6 ns and more than 3 × 105 operation cycles. An excellent performance was derived from the reduced grain size (10 nm) and the smaller density change rate (4.76%), which are less than those of Ge2Sb2Te5 (GST) and Sb2Te3. Hence, platinum doping is an effective approach to improve the performance of PCM and provide both good thermal stability and high operation speed. [ABSTRACT FROM AUTHOR]

To solve the problems of complex structure, poor reliability, and low intelligence of existing fan clutches for large hybrid vehicles, this paper proposes a new adaptive shape memory alloy intelligent fan clutch for large hybrid vehicle motor cooling. Based on the pure shear shape memory alloy thermodynamic effects, the relationship between shape memory alloy spring recovery force and temperature has been established; based on the shape memory alloy spring thermal drive characteristics and clutch construction dimensions, clutch torque transmission equations have been established. The shape memory alloy fan clutch transmission characteristics were quantitatively analyzed in terms of temperature, torque, rotational speed, and slip rate. The results show that the shape memory alloy fan clutch model based on the finite element method (FEM) and the established transmission model can accurately describe the mechanical characteristics of the shape memory alloy phase change process and the clutch torque transmission characteristics. When the clutch input speed is 3000 rad/min and the temperature is 100 °C, the output torque is 19.04 N·m, the speed is 2877.2 rad/min, and the slip rate is 4.3%. Due to the shape memory effect of shape memory alloy, the clutch can intelligently adjust the fan speed by sensing the ambient temperature. A fan clutch can satisfy the heat dissipation requirement of a large hybrid vehicle's transmission system under complicated road conditions. [ABSTRACT FROM AUTHOR]

With the increasing demand of massive/big data applications, nonvolatile memory (NVM), such as phase-change memory (PCM), has become a promising candidate to replace DRAM because of its low leakage power, nonvolatility, and high density. However, most of the existing memory read/write intensive algorithms and data structures are not aware of the PCM write heterogeneity in terms of both energy consumption and latency. In particular, self-balancing binary search trees, which are widely used to manage massive data in the big-data era, were designed without the consideration of PCM characteristics. Thus, the multiple rotations of the tree balancing process would degrade the memory performance. This work explores the relations among nodes and analyzes tree operations, and the node indexing and address mapping are redesigned to reduce the tree management overhead on single-level cell (SLC) PCM by decreasing the number of bit flips of tree rotations. When multilevel cell (MLC) PCM is included, our address mapping algorithm is developed to reduce the total energy consumption and latency with considerations of the heterogeneous write operations of different cell states. Experimental results show that our solution significantly outperforms the original implementation of a self-balancing binary search tree when the amount of data is large. [ABSTRACT FROM AUTHOR]

In this article, we present a main memory system for improving the lifetime and security of phase-change main memories. Storing encrypted data increases the bit-flip rates in memory cells, which adversely affects the lifetime of the phase-change memory cells. Thus, to improve the lifetime and security, the proposed system reduces the bit-flip rates by introducing two techniques. The first technique is a memory-side encryption which provides security against DIMM stealing attacks. To prevent unauthorized accesses, in this technique, the encrypted data are not saved in the main memory. As the second technique, we suggest an adaptive partial encryption approach, which makes use of behavior tracking of the application in the CPU side to minimize the latency overhead of the first technique. Additionally, it prevents the loss of data against application-based attacks. This technique uses a recurrent neural network (RNN) to do sequence classification and detect malicious applications. In addition, an auxiliary method, called periodic encryption (PE), which overcomes the security loss in some applications induced by the low accuracy of the employed neural network, is presented. The efficacy of the proposed method is evaluated using gem5 simulator and some benchmarks. Compared to DEUCE and Crypto-Comp methods, the results for the lifetime evaluation show an average bit-flip rate reduction of 11%. In addition, the security improvements against the DIMM stealing and application-based attacks are about 100% and 92.5%, respectively. [ABSTRACT FROM AUTHOR]

The article discusses about an integrated photonics engine for correlation detection. Topics including effect of modern life and scientific tools on the amount of data generated exponentially, about computational memory engine and how it exploits the accumulative property of different cells, and experimental demonstration of identifying real-time correlations in data streams on different social media platform.

Non-volatile memories based on phase-change materials have gained ground for applications in analog in-memory computing. Nonetheless, non-idealities inherent to the material result in device resistance variations that impair the achievable numerical precision. Projected-type phase-change memory devices reduce these non-idealities. In a projected phase-change memory, the phase-change storage mechanism is decoupled from the information retrieval process by using projection of the phase-change material's phase configuration onto a projection liner. It has been suggested that the interface resistance between the phase-change material and the projection liner is an important parameter that dictates the efficacy of the projection. In this work, we establish a metrology framework to assess and understand the relevant structural properties of the interfaces in thin films contained in projected memory devices. Using X-ray reflectivity, X-ray diffraction and transmission electron microscopy, we investigate the quality of the interfaces and the layers' properties. Using demonstrator examples of Sb and Sb2Te3 phase-change materials, new deposition routes as well as stack designs are proposed to enhance the phase-change material to a projection-liner interface and the robustness of material stacks in the devices. [ABSTRACT FROM AUTHOR]

Indexing is a well-known database technique used to facilitate data access and speed up query processing. Nevertheless, the construction and modification of indexes are very expensive. In traditional approaches, all records in the database table are equally covered by the index. It is not effective, since some records may be queried very often and some never. To avoid this problem, adaptive merging has been introduced. The key idea is to create an index adaptively and incrementally as a side-product of query processing. As a result, the database table is indexed partially depending on the query workload. This paper faces the problem of adaptive merging for phase change memory (PCM). The most important features of this memory type are limited write endurance and high write latency. As a consequence, adaptive merging should be investigated from the scratch. We solve this problem in two steps. First, we apply several PCM optimization techniques to the traditional adaptive merging approach. We prove that the proposed method (eAM) outperforms a traditional approach by 60%. After that, we invent the framework for adaptive merging (PAM) and propose a new variant of the PCM-optimized index. It further improves the system performance by 20% for databases where search queries interleave with data modifications. [ABSTRACT FROM AUTHOR]

Phase Change Memory (PCM), with its better scaling potential compared to DRAM, is seen as a promising candidate to replace or complement DRAM. The heat generated from a RESET programming pulse to a PCM cell can disturb the neighboring cells which are not being programmed. Write disturbance (WD) poses a critical reliability challenge in high-density PCM memory with scaling below 20nm process technology node. Increasing the intra-cell space can eliminate the WD, however, it reduces the storage density which counteracts the benefits of scalability in PCM. At architectural level, a verify and correct (VnC) technique can be used to address this problem. However, this leads to an increased number of write operations, thus degrading performance, energy efficiency and memory lifetime. Due to its dependence on the type of programming operation and the state of the neighboring cell, WD is a data-dependent problem. Exploiting this property, encoding techniques have been proposed to reduce the frequency of WD-vulnerable data patterns. These techniques, however, do not eliminate the WD in an array and ultimately rely on the VnC method to ensure reliable memory operation. This article introduces a novel architecture, based on encoding and multi-level programming characteristics of PCM, to eliminate the intra-array WD in PCM. By eliminating WD and hence the need for a VnC operation, the proposed architecture improves performance, energy efficiency and memory lifetime. Our evaluation of the proposed architecture shows an average reduction of 57 percent in the number of writes (to service one write request) over the existing state-of-the-art intra-array WD-mitigation technique. Depending on the PCM write bandwidth, the proposed architecture can reduce the write service time by up to 27 percent, on average, compared to the existing best-performing technique. This leads to an average improvement of 15 percent in IPC. Additionally, by eliminating the overhead of a verify operation, the write energy efficiency is also improved by 8 percent over the previous art. Finally, with an average reduction of 26 percent in bit flips, the proposed method also improves the memory lifetime. The proposed method is also proven to be effective when considering WD both within the word-lines and across the bit-lines. [ABSTRACT FROM AUTHOR]

Phase Change Memory (PCM) is an emerging technology exploiting the rapid and reversible phase transition of certain chalcogenides to realize nanoscale memory elements. PCM devices are being explored as non-volatile storage-class memory and as computing elements for in-memory and neuromorphic computing. It is well-known that PCM exhibits several characteristics of a memristive device. In this work, based on the essential physical attributes of PCM devices, we exploit the concept of Dynamic Route Map (DRM) to capture the complex physics underlying these devices to describe them as memristive devices defined by a state—dependent Ohm's law. The efficacy of the DRM has been proven by comparing numerical results with experimental data obtained on PCM devices. [ABSTRACT FROM AUTHOR]

Phase Change Memory (PCM) is an emerging technology exploiting the rapid and reversible phase transition of certain chalcogenides to realize nanoscale memory elements. PCM devices are being explored as non-volatile storage-class memory and as computing elements for in-memory and neuromorphic computing. It is well-known that PCM exhibits several characteristics of a memristive device. In this work, based on the essential physical attributes of PCM devices, we exploit the concept of Dynamic Route Map (DRM) to capture the complex physics underlying these devices to describe them as memristive devices defined by a state—dependent Ohm's law. The efficacy of the DRM has been proven by comparing numerical results with experimental data obtained on PCM devices. [ABSTRACT FROM AUTHOR]

Te-based alloys are widely used for Phase Change Random Access Memory (PCRAM). The investigation of the Te-based phase diagram gives significant benefit to the development of Te-based PCRAM materials. Thermodynamic modelling of the Te-X (X = Cu, Ga, Li, Sr) systems has been carried out using the CALculation of PHAse Diagrams (CALPHAD) method based on the enthalpies of formation calculated by first-principles calculations in the present work and available experimental data in the literature. In the Te-Cu, Te-Ga and Te-Li systems, the liquid phases were separately described by the associated solution model with Cu2Te, Ga2Te3 and Li2Te associate species. A set of self-consistent thermodynamic parameters for the Te-X (X = Cu, Ga, Li, Sr) systems was obtained. Comparison between the calculated results and available experimental data indicates that most experimental information can be satisfactorily accounted for by modelling. [ABSTRACT FROM AUTHOR]

Via in situ transmission electron microscopy, we observed on nanoscale unconventional structural evolution during two-dimensional (2D) phase transitions in a Sb 2 Te 3 /TiTe 2 phase-change heterostructure (PCH), which reduces amorphous relxation and crystallization stochasiticity to facilitate rapid and reliable memory programming. [Display omitted] Phase-change heterostructure (PCH) holds great promise for overcoming the low-precision bottleneck that limits multibit storage and parallel computing in conventional phase-change random-access memory. However, the origin of high-accuracy control of electrical resistance achieved in programming PCH memory devices has yet to be established. Via in situ transmission electron microscopy, here we unveil the unusual microscopic processes during the order–disorder phase transitions driven by electrical pulse in a Sb 2 Te 3 /TiTe 2 PCH architecture. The template-modulated phase transition is confirmed to be two-dimensional (2D) in nature. The structural transformation path and dynamics in the confined Sb 2 Te 3 sublayers are found to be profoundly changed with respect to those in bulk monolithic Sb 2 Te 3 , leading to markedly suppressed amorphous relaxation and substantially reduced crystallization stochasticity, both highly desirable for swift and accurate device operations. Our atomic-scale observations provide direct evidence of, and much-needed insight into, the working mechanisms that may enable superior 2D phase-change electronic devices. [ABSTRACT FROM AUTHOR]