333 results on '"Mcmorrow, Dale"'
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2. A generalized model for single event transient propagation in phase-locked loops
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3. Gate bias dependence of single event charge collection in AlSb/InAs HEMTs
4. Estimation of heavy-ion LET thresholds in advanced SOI IC technologies from two-photon absorption laser measurements
5. Effects of ionizing radiation on digital single event transients in an 180-nm fully depleted SOI process
6. TPA laser and heavy-ion SEE testing: complementary technques for SDRAM single-event evaluation
7. Effect of total ionizing dose on a bulk 130 nm ring oscillator operating at ultra-low power
8. The effects of elevated temperature on pulsed-laser-induced single event transients in analog devices
9. Temperature dependence of digital single-event transients in bulk and fully-depleted SOI technologies
10. Heavy ion microbeam- and broadbeam-induced transients in SiGe HBTs
11. Device-physics-based analytical model for single-event transients in SOI CMOS logic
12. A probabilistic analysis technique applied to a radiation-hardened-by-design voltage-controlled oscillator for mixed-signal phase-locked loops
13. Pulsed laser single-event effects in highly scaled CMOS technologies in the presence of dense metal coverage
14. The effects of low dose-rate ionizing radiation on the shapes of transients in the LM 124 operational amplifier
15. Laser verification of on-chip charge-collection measurement circuit
16. Laser-induced current transients in silicon-germanium HBTs
17. Waveform observation of digital single-event transients employing monitoring transistor technique
18. Generation and propagation of single event transients in 0.18-[micro]m fully depleted SOI
19. Measurement and analysis of interconnect crosstalk due to single events in a 90 nm CMOS technology
20. Total dose effects on error rates in linear bipolar systems
21. Measurement of the transient response of semiconductor devices to ionizing radiation
22. Transient radiation response of single- and multiple-gate FD SOI transistors
23. Transient response of semiconductor electronics to ionizing radiation. Recent developments in charge-collection measurement
24. SEU error signature analysis of Gbit/s SiGe logic circuits using a pulsed laser microprobe
25. Single-event transients in bipolar linear integrated circuits
26. Laser-induced latchup screening and mitigation in CMOS devices
27. Photoluminescence Properties of Conjugated Phenylacetylene Monodendrons in Thin Films
28. Single-event upset in flip-chip SRAM induced by through-wafer, two-photon absorption
29. Simultaneous single event charge sharing and parasitic bipolar conduction in a highly-scaled SRAM design
30. The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM
31. Validity of using a fixed analog input for evaluating the SEU sensitivity of a flash analog-to-digital converter
32. Pulsed-laser testing methodology for single event transients in linear devices
33. Demonstration of single-event effects induced by through-wafer two-photon absorption
34. Investigation of millisecond-long analog single-event transients in the LM6144 op amp
35. A comparative study of heavy-ion and proton-induced bit-error sensitivity and complex burst-error modes in commercially available high-speed SiGe BiCMOS
36. Transient response of III-V field-effect transistors to heavy-ion irradiation
37. Three-dimensional mapping of single-event effects using two photon absorption
38. Modeling single-event effects in a complex digital device
39. Ultrafast dynamics of gold-based nanocomposite materials
40. Voltage-Controlled Oscillator Utilizing Inverse-Mode SiGe-HBT Biasing Circuit for the Mitigation of Single-Event Effects.
41. Comparison of SETs in bipolar linear circuits generated with an ion microbeam, laser light, and circuit simulation
42. Subbandgap laser-induced single event effects: carrier generation via two-photon absorption
43. Charge-collection dynamics of InP-based high electron mobility transistors (HEMTs)
44. Charge-collection dynamics of AISb-InAs-GaSb resonant interband tunneling diodes (RITDs)
45. Analysis of intermolecular coordinate contributions to third-order ultrafast spectroscopy of liquids in the harmonic oscillator limit
46. Using Machine Learning to Mitigate Single-Event Upsets in RF Circuits and Systems.
47. Pulsed-Laser Testing to Quantitatively Evaluate Latchup Sensitivity in Mixed-Signal ASICs.
48. Pulsed laser-induced single event upset and charge collection measurements as a function of optical penetration depth
49. Charge-enhancement mechanisms of GaAs field-effect transistors: experiment and simulation
50. Charge-collection mechanisms of AlGaAs/GaAs HBTs
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