49 results on '"Rosenbaum, Elyse"'
Search Results
2. Neural Ordinary Differential Equation Models of Circuits: Capabilities and Pitfalls.
3. Compact modeling of on-chip ESD protection devices using Verilog-A
4. An automated and efficient substrate noise analysis tool
5. Comprehensive study of drain breakdown in MOSFETs
6. Gate oxide reliability under ESD-like pulse stress
7. Projecting lifetime of deep submicron MOSEFTs
8. Comprehensive ESD protection for RF inputs
9. Statistical Learning of IC Models for System-Level ESD Simulation.
10. ILLIADS-T: an electrothermal timing simulator for temperature-sensitive reliability diagnosis of CMOS VLSI chips
11. iTEM: a temperature-dependent electromigration reliability diagnosis tool
12. Heat flow analysis for EOS/ESD protection device design in SOI technology
13. Mechanism of stress-induced leakage current in MOS capacitors
14. Accelerated testing of SiO2 reliability
15. Circuit-level simulation of TDDB failure in digital CMOS circuits
16. Silicon dioxide breakdown lifetime enhancement under bipolar bias conditions
17. A bidirectional NMOSFET current reduction model for simulation of hot-carrier-induced circuit degradation
18. Berkeley Reliability Tools - BERT
19. Simulator-independent compact modeling of vertical npn transistors for ESD and RF circuit simulation
20. Trap generation and breakdown processes in very thin gate oxides
21. Electrothermal model for simulation of bulk-Si and SOI diodes in ESD protection circuits
22. Special Issue on Reliability.
23. Measurement and Simulation of On-Chip Supply Noise Induced by System-Level ESD.
24. Soft-Failures Induced by System-Level ESD.
25. ESD Self-Protection of High-Speed Transceivers Using Adaptive Active Bias Conditioning.
26. CDM-Reliable T-Coil Techniques for a 25-Gb/s Wireline Receiver Front-End.
27. Full-Component Modeling and Simulation of Charged Device Model ESD.
28. Physical Basis for CMOS SCR Compact Models.
29. Charged Device Model Reliability of Three-Dimensional Integrated Circuits.
30. Analysis of Active-Clamp Response to Power-On ESD: Power Supply Integrity and Performance Tradeoffs.
31. Prediction of Charged Device Model Peak Discharge Current for Microelectronic Components.
32. Verification of Snapback Model by Transient I–V Measurement for Circuit Simulation of ESD Response.
33. Comparison of FICDM and Wafer-Level CDM Test Methods.
34. Diode-Triggered Silicon-Controlled Rectifier With Reduced Voltage Overshoot for CDM ESD Protection.
35. Comparison of Wafer-Level With Package-Level CDM Stress Facilitated by Real-Time Probing.
36. Modeling and Understanding of External Latchup in CMOS Technologies—Part II: Minority Carrier Collection Efficiency.
37. Modeling and Understanding of External Latchup in CMOS Technologies—Part I: Modeling Latchup Trigger Current.
38. A Scalable SCR Compact Model for ESD Circuit Simulation.
39. A new compact model for external latchup
40. Layout Optimization of ESD Protection Diodes for High-Frequency I/Os.
41. Piecewise-Linear Model With Transient Relaxation for Circuit-Level ESD Simulation.
42. A Compact, ESD-Protected, SiGe BiCMOS LNA for Ultra-Wideband Applications.
43. High-Q Electrostatic Discharge (ES D) Protection Devices for Use at Radio Frequency (RF) and Broad-band I/O Pins.
44. Critical Evaluation of SOT Design Guidelines.
45. Projecting Lifetime of Deep Submicron MOSFETs.
46. Oscillatory Transmission Line Pulsing for Characterization of Device Transient Response.
47. Analytic model for direct tunneling current in polycrystalline silicon-gate...
48. DATA-DRIVEN RELIABILITY FOR DATACENTER HARD DISK DRIVES.
49. BETTER PERFORMANCE, HIGHER RELIABILITY, MORE SECURITY: RESEARCH HIGHLIGHTS FROM THE CENTER FOR ADVANCED ELECTRONICS THROUGH MACHINE LEARNING.
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.