15 results on '"Chien, Wei-Ting Kary"'
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2. Practical 'Building-in Reliability' approaches for semiconductor manufacturing
3. Some practical concerns on isothermal electromigration tests
4. A nonparametric approach to estimate system burn-in time
5. Modeling & maximizing burn-in effectiveness
6. AdaBalGAN: An Improved Generative Adversarial Network With Imbalanced Learning for Wafer Defective Pattern Recognition
7. Fast Semiconductor Reliability Assessments Using SPRT
8. Statistical Process Control for Monitoring the Particles With Excess Zero Counts in Semiconductor Manufacturing
9. Use of the dirichlet process for reliability analysis
10. Electromigration Lifetime Optimization by Uniform Designs and a New Lifetime Index
11. Reliability Baseline Management and Applications in Semiconductor Manufacturing
12. Editorial: Reduce Time-to-Market by Considering Reliability Tradeoffs
13. A Practical, Innovative Method for Electro-Static Discharge Data Analysis
14. USING REVERSE ARRANGEMENT TEST TO DETECT NON-MONOTONIC TRENDS FOR SEMICONDUCTOR MANUFACTURING AND RELIABILITY TESTS
15. A New Method to Determine the Reliability Comparability for Products, Components, and Systems in Reliability Testing
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