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60 results on '"Mami N. Fujii"'

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1. High performance top gate a-IGZO TFT utilizing siloxane hybrid material as a gate insulator

2. Nano-crystallization in ZnO-doped In2O3 thin films via excimer laser annealing for thin-film transistors

3. Atomic Imaging of Interface Defects in an Insulating Film on Diamond

7. Improvement in Bias Stress Stability of Solution-Processed Amorphous InZnO Thin-Film Transistors via Low-Temperature Photosensitive Passivation

8. 7‐2: Invited Paper: Hot Carrier Degradation in High Mobility Metal Oxide Thin Film Transistors

10. 30‐3: High Performance All Solution Processed Oxide Thin‐Film Transistor via Photo‐induced Semiconductor‐to‐Conductor Transformation of a‐InZnO

11. Orientation dependent etching of polycrystalline diamond by hydrogen plasma

12. SrTa2O6 induced low voltage operation of InGaZnO thin-film transistors

13. Self-Heating Suppressed Structure of a-IGZO Thin-Film Transistor

15. High reliability InGaZnO TFT by inductively coupled plasma sputtering system

16. Low Temperature High-k Solution Processed Hybrid Gate Insulator for High Performance Amorphous In-Ga-Zn-O Thin-Film Transistors

17. Reactivity and stability of thallium oxide for fabricating TlSnZnO toward thin-film transistors with high mobility

18. Reliability Improvement of Amorphous InGaZnO Thin-Film Transistors by Less Hydroxyl-Groups Siloxane Passivation

19. Enhancement in Reliability of a-InZnO TFT by Fluorine-Doped Polysilsesquioxane Passivation with Spray Pyrolysis

21. Erratum: High Performance Amorphous In–Ga–Zn–O Thin-Film Transistors with Low Temperature High-k Solution Processed Hybrid Gate Insulator [ ECS J. Solid State Sci. Technol., 9, 025002 (2020)]

22. Unique degradation under AC stress in high-mobility amorphous In–W–Zn–O thin-film transistors

23. Bias stress and humidity exposure of amorphous InGaZnO thin-film transistors with atomic layer deposited Al2O3 passivation using dimethylaluminum hydride at 200 °C

24. High Performance Amorphous In–Ga–Zn–O Thin-Film Transistors with Low Temperature High-k Solution Processed Hybrid Gate Insulator

25. Reliability Enhancement of Solution Processed Amorphous In-Zn-O Thin-Film Transistors via a Low Temperature (180 °C) Solution Processed Passivation

26. Threshold Voltage Control of In-Ga-Zn-O TFT without Thermal Annealing Process by Inductively Coupled Plasma Sputtering System

27. Instantaneous Semiconductor-to-Conductor Transformation of a Transparent Oxide Semiconductor a-InGaZnO at 45 °C

28. Comparison between Effects of PECVD-SiOxand Thermal ALD-AlOxPassivation Layers on Characteristics of Amorphous InGaZnO TFTs

29. Rapid photo-assisted activation and enhancement of solution-processed InZnO thin-film transistors

30. Hot carrier effects in InGaZnO thin-film transistor

31. Degradation phenomenon in metal-oxide-semiconductor thin-film transistors and techniques for its reliability evaluation and suppression

32. Highly reliable low-temperature (180 °C) solution-processed passivation for amorphous In–Zn–O thin-film transistors

33. Improvement of the stability of an electric double-layer transistor using a 1H,1H,2H,2H-perfluorodecyltriethoxysilane barrier layer

34. Properties of TlZnSnO film fabricated via sputtering from TlZnSnO target

35. High performance top gate a-IGZO TFT utilizing siloxane hybrid material as a gate insulator

36. (Invited) High Density IGZO Film for Highly Reliable TFT By Inductively Coupled Plasma Sputtering Technology in Low Temperature Process

37. Dimethylaluminum hydride for atomic layer deposition of Al2O3 passivation for amorphous InGaZnO thin-film transistors

38. Significant mobility improvement of amorphous In-Ga-Zn-O thin-film transistors annealed in a low temperature wet ambient environment

39. Improvement of Amorphous InGaZnO Thin-Film Transistor Using High-k SrTa2 O6 as Gate Insulator Deposited by Sputtering Method

40. High-density carrier-accumulated and electrically stable oxide thin-film transistors from ion-gel gate dielectric

41. Evaluation of stress stabilities in amorphous In–Ga–Zn–O thin-film transistors: Effect of passivation with Si-based resin

42. H and Au diffusion in high mobility a-InGaZnO thin-film transistors via low temperature KrF excimer laser annealing

43. Nano-crystallization in ZnO-doped In2O3 thin films via excimer laser annealing for thin-film transistors

44. Self-heating induced instability of oxide thin film transistors under dynamic stress

45. Effect of excimer laser annealing ona-InGaZnO thin-film transistors passivated by solution-processed hybrid passivation layers

46. Highly reliable photosensitive organic-inorganic hybrid passivation layers for a-InGaZnO thin-film transistors

47. Bias stress and humidity exposure of amorphous InGaZnO thin-film transistors with atomic layer deposited Al2O3 passivation using dimethylaluminum hydride at 200 °C.

48. Rapid photo-assisted activation and enhancement of solution-processed InZnO thin-film transistors.

49. Hot carrier effects in InGaZnO thin-film transistor.

50. Degradation phenomenon in metal-oxide-semiconductor thin-film transistors and techniques for its reliability evaluation and suppression.

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