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Undetectable faults result from logic redundancies and constraints on applicable tests. The presence of an undetected (undetectable or aborted) fault implies that a test, which would have covered its site, is missing from the test set. When undetected transition faults form a path, the missing tests imply that (small) delay defects along the path may not be detected even if they are detectable. The goal of this article is to provide additional coverage for paths of undetected transition faults by using two-cycle gate-exhaustive faults for subcircuits (gates) that wrap the paths. The use of gate-exhaustive faults alleviates the need to model delay defects along the paths, or use path delay faults that may also be undetectable. The article defines the target paths, and gates that wrap them, for which two-cycle gate-exhaustive faults can be defined. Experimental results for benchmark circuits demonstrate the discussion. [ABSTRACT FROM AUTHOR]

Time-sensitive networking (TSN) is an industry-standard networking protocol that is widely deployed in safety-critical industrial and automotive networks thanks to its quality-of-service (QoS) mechanisms, esp. deterministic transmission and bounded end-to-end delay for time-triggered (TT) flows. In this article, we focus on TT flows and address the issue of fault tolerance against permanent and transient faults with both spatial and temporal redundancy. We present an efficient heuristic algorithm for online incremental rerouting and rescheduling of disrupted flows, assuming the paths and schedules of existing flows stay fixed. It is complementary to and can be combined with offline routing and scheduling algorithms for achieving fault tolerance based on frame replication and elimination for reliability (FRER) (IEEE 802.1CB). Performance evaluation shows that our approach is able to better recover the system’s degree of redundancy (DoR) and has a higher acceptance rate than related work. [ABSTRACT FROM AUTHOR]

Reducing the number of AND gates in logic networks benefits the applications in cryptography, security, and quantum computing. This work proposes a don’t-care-based (DC-based) approach to reduce the number of AND gates further in the well-optimized network. Furthermore, this work also proposes an enhanced synthesis flow by integrating our approach with the state-of-the-art. The experimental results show that our approach can further reduce up to 25% of the number of AND gates in the network. For the experiments about the enhanced synthesis flow, we achieve a speedup of almost $10\times $ on average for the cryptography benchmarks while having competitive results as compared to the flow in the state-of-the-art. [ABSTRACT FROM AUTHOR]

Path delay faults model small delay defects that affect the operation of the circuit when they accumulate along a path. For lines on a path, the propagation conditions can be related to those of transition faults. Two-cycle defect-aware, cell-aware and gate-exhaustive faults model delay defects with more complex activation conditions than transition faults. This article observes that detecting gate-exhaustive faults along a path results in the detection of small delay defects with more complex activation conditions than transition faults. Such path delay faults are referred to as gate-exhaustive path delay faults. This article defines gate-exhaustive path delay faults and describes a path selection procedure to support test generation. The experimental results for benchmark circuits demonstrate the possibility of detecting gate-exhaustive path delay faults. [ABSTRACT FROM AUTHOR]

Contemporary and emergent automotive systems are heavily populated by complex integrated electronics. The number of safety-critical devices used in advanced driver-assistance systems or autonomous vehicles is growing with high-end models containing hundreds of embedded microcontrollers. Achieving functionally safe automotive electronics requires test solutions that might be costly to engineer. Therefore, to address challenges posed by high-quality and long-term reliability requirements, this article presents low-cost test pattern generation schemes for a scan-based hybrid logic BIST of automotive ICs. It may allow one to optimize test coverage and test time during in-system test applications. The first presented technique deploys a seed-flipping PRPG to periodically complement PRPG stages in a methodical tree-traversal manner. The second scheme is based on a seed-sorting approach that allows additional tradeoffs between test data volume and test coverage. As shown in this article, the proposed schemes can be easily integrated with a test compression environment and deployed in different modes of in-system testing, such as key-off, key-on, and periodic (incremental) online tests. Experimental results obtained for automotive designs and reported herein show improvements in test quality over conventional logic BIST schemes. [ABSTRACT FROM AUTHOR]

The RISC-V instruction set architecture open licensing policy has spawned a hive of development activity, making a range of implementations publicly available. The environments in which RISC-V operates have expanded correspondingly, driving the need for a generalized approach to evaluating the reliability of RISC-V implementations under adverse operating conditions or after normal wear-out periods. Fault injection (FI) refers to the process of changing the state of registers or wires, either permanently or momentarily, and then observing execution behavior. The analysis provides insight into the development of countermeasures that protect against the leakage or corruption of sensitive information, which might occur because of unexpected execution behavior. In this article, we develop a hardware–software co-design architecture that enables fast, configurable fault emulation and utilize it for information leakage and data corruption analysis. Modern system-on-chip FPGAs enable building an evaluation platform, where control elements run on a processor(s) (PS) simultaneously with the target design running in the programmable logic (PL). Software components of the FI system introduce faults and report execution behavior. A pair of RISC-V FI-instrumented implementations are created and configured to execute the Advanced Encryption Standard and Twister algorithms. Key and plaintext information leakage and degraded pseudorandom sequences are both observed in the output for a subset of the emulated faults. [ABSTRACT FROM AUTHOR]

Fault-injection attacks have become a major concern for hardware designs, primarily due to their powerful capability in tampering with critical locations in a device to cause violation of its integrity, confidentiality, and availability. Researchers have proposed a number of physical and architectural countermeasures against fault-injection attacks; however, these techniques usually come with large overhead and design efforts making them difficult to use in practice. In addition, the current electronic design automation (EDA) tools are not fully equipped to support vulnerability assessment against fault-injection attacks at the design-time for secure hardware development. To perform a design-time (i.e., presilicon) evaluation of such attacks, a designer should be aware of various security vulnerabilities and must perform a tedious manual design review, which is time-consuming and hard to ensure effectiveness. Therefore, it is very important to develop an automatic assessment framework to identify the most security-critical locations in a design to fault-injection attacks and place emphasis on protecting those locations. In this article, we propose an automated framework for fault-injection vulnerability assessment of designs at gate-level, while considering the design-specific security properties (SPs) using novel models and metrics. The proposed framework identifies the faults that can violate the SPs of the design. As a result, applying local countermeasures will be more effective and the protection overhead will be reduced significantly. Our experimental results on the SP of AES, RSA, and SHA implementations show that the security threat from fault-injection attacks can be significantly mitigated by protecting the identified critical locations, which are less than 0.6% of the design. [ABSTRACT FROM AUTHOR]

Exponentiation in finite fields is an essential operation used in many applications ranging from error control coding to cryptographic computations, while representation in Gaussian normal basis (GNB) offers low complexity arithmetic, especially in hardware architectures. In this article, we propose several new hardware architectures for binary exponentiation in GNB. The proposed architectures make use of different levels of precomputation and the efficient digit-level parallel-in parallel-out, and hybrid-double multipliers. We support our new designs with novel countermeasures against side-channel analysis that require minimal implementation overhead. Moreover, we obtain implementation results for all architectures and provide realistic and fair comparisons with the previously known works available in the literature. It is shown that our newly proposed architectures outperform the existing hardware architectures in terms of area and time complexities and security. [ABSTRACT FROM AUTHOR]

As a superset of cell-aware faults, gate-exhaustive faults provide a target for the generation of a comprehensive test set. Considering two-cycle gate-exhaustive faults, the number of faults can be excessive, and many of the faults are undetectable. This article considers the efficient identification of undetectable two-cycle gate-exhaustive faults. To take advantage of the large numbers of necessary assignments the faults have, the procedure described in this article is based on the computation of input necessary assignments. This article also notes that gates with large percentages of undetectable two-cycle gate-exhaustive faults are more important to target for test generation. Experimental results are presented for such gates in benchmark circuits. [ABSTRACT FROM AUTHOR]

Quantum-dot cellular automata (QCA) is considered as a promising emerging technology due to its low power dissipation and high device density. Since the majority function is the main operation in QCA circuits, minimizing the number of majority gates in QCA circuits is crucial to the corresponding QCA circuit minimization. A previous work used the node-merging technique to replace one target node with an existing substitute node in majority circuits for optimization. However, this technique may fail when no substitute nodes exist for a target node. In this article, we propose an enhanced optimization technique for majority circuits by adding a new node into the circuits and removing the target node and its fanin nodes. The experimental results show that this technique improves the results of the node-merging technique on a set of EPFL logic synthesis benchmarks. Additionally, this enhanced technique can work together with other optimization techniques. The circuit size reduction in the integrated approach reaches 1.26 times as compared to the results using the node-merging technique. [ABSTRACT FROM AUTHOR]

LOOPLock is the state-of-the-art cyclic logic locking method in hardware security. LOOPLock is able to invalidate SAT Attack, Removal Attack, and CycSAT simultaneously by introducing two types of cycle pairs in a circuit. In this work, we analyze LOOPLock’s locking mechanism and propose an attacking approach based on locking structure analysis. Furthermore, to defend the new attack, we propose LOOPLock 2.0, which strengthens the original cyclic logic locking method—LOOPLock. Experimental results show the efficiency and effectiveness of the proposed attacking approach to LOOPLock and the high defense capability of LOOPLock 2.0. [ABSTRACT FROM AUTHOR]

Built-in self-test (BIST) approaches are suitable for in-field testing since they do not require a tester for storage and application of test data. They also reduce the security vulnerabilities associated with loading and unloading of external test data into scan chains. As technologies evolve, in-field testing needs to address more complex defect and aging mechanisms that require specific deterministic tests. This can be addressed by BIST approaches that store test data on-chip and use the data for on-chip generation of both random and deterministic tests. In this case, there is a tradeoff between the amount of stored test data and the comprehensiveness of the test set that can be applied. This article explores this tradeoff in a specific context that has the following main features: 1) the initial stored test data is based on a stuck-at test set; 2) the target faults are single-cycle gate-exhaustive faults; and 3) the stored test data is enhanced gradually by test data based on a gate-exhaustive test set to increase the coverage of gate-exhaustive faults. [ABSTRACT FROM AUTHOR]

Dynamic test compaction procedures use independent fault sets to guide the generation of compact test sets. In addition, a maximal independent fault set provides a lower bound on the number of tests, and can thus be used for evaluating the level of test compaction. This article notes that defect-aware, cell-aware, and gate-exhaustive faults have certain properties that can be used in the computation of independent fault sets. This article focuses on gate-exhaustive faults and the computation of a maximal independent fault set. The experimental results for benchmark circuits support the discussion. [ABSTRACT FROM AUTHOR]

Oracle guided attacks, such as the satisfiability attack, are a significant concern when obfuscating an integrated circuit (IC). Partitioned finite state machine (FSM) based sequential logic locking techniques are much more resilient to oracle guided attacks due to the differences in the state space between the oracle and the IC under attack. However, susceptibility to structural attacks and the extraction of the transition state between the obfuscated and functional modes of an FSM threaten the efficacy of sequential logic locking. Therefore, a methodology to synthesize hidden state transitions (HSTs) into an FSM within an IC is developed. HSTs and logic cone modifications are utilized to further enhance the security of sequentially locked circuits by increasing the number of paths an adversary must search and reducing the susceptibility to structural attacks. An algorithm to insert hidden transitions and logic cone modifications into a netlist is developed that results in an average overhead of 6.79% in area, 7.78% in power, and 8.28% in performance across all of the ISCAS’89 sequential benchmark circuits. To modify the logic cone with two altered minterms, the average increase in area and power, beyond what is needed for the implementation of HSTs, is 26.46% and 30.30%, respectively, with no additional overhead in performance. [ABSTRACT FROM AUTHOR]

Power gating is effective for networks-on-chip (NoCs) to reduce the excessive leakage power dissipated by idle network components. Most existing NoC power-gating approaches rely on the routing algorithms to mitigate the power-gating blocking latency problem. When the network becomes faulty and fault-tolerant routing algorithms are applied, these approaches are no longer applicable or can seriously degrade the performance. Other approaches propose fine-grained buffer power gating, but they are too conservative in power saving due to the buffer backpressure flow control. To address these problems, we propose an aggressive fine-grained power gating of flit-sized buffer entries by adopting backpressureless flow control in an input-buffered network. The power-gating decisions are made based on the flit deflection rate. However, directly applying the backpressureless flow control leads to the difficulties of multiflit packet truncation and protocol deadlocks. Therefore, we modify the packet injection architecture to avoid packet truncation. This is done by chaining the local input port with a randomly chosen input port. Finally, we design a progressive recovery framework to handle both livelocks and protocol deadlocks. It does not need to truncate packets or strictly separate different message classes when the network is free of livelocks or protocol deadlocks. The experimental results show that with a hardware overhead of 9.6%, our design can save up to 59% network power consumption in both a fault-free and a faulty NoC with little zero-load latency penalty. Our design also approaches an ideal energy-proportional NoC because it can constantly reduce power consumption over a wide range of injection rates. [ABSTRACT FROM AUTHOR]

A novel test pattern generation method for multiple dc and ac faults is presented. The fault models considered include line stuck-at, bridging, transition, and transistor stuck-open faults. All faults are transformed into stuck-at faults with some constraints in the proposed two-timeframe circuit model such that all considered faults can be represented utilizing the user-defined fault model supported currently by most commercial ATPG tools. This makes it possible to generate a compact set of patterns for both dc and ac faults in one ATPG run without needing to modify the ATPG tool. Both launch-on-capture and launch-on-shift test methods are supported. The experimental results on ISCAS’89 and ITC’99 benchmark circuits show the effectiveness of the proposed method (PM) compared to earlier PMs. [ABSTRACT FROM AUTHOR]

Traditionally, increasing logical masking probability has been used to improve the circuit reliability against single-event transients (SETs). As the very first work, this paper presents a new approach to increase the reliability of digital circuits against soft errors caused by multiple event transients (METs) by taking advantages of circuit partitioning and local logical restructuring techniques. In the proposed approach, the circuit is partitioned into various subcircuits and, then, several structures of each subcircuits which satisfy the area constraints are extracted by using a graph-based procedure. In order to select the suitable alternative between various subcircuit structures, we introduce a novel metric named global failure probability in the presence of METs (GFPM). This parameter provides an evaluation of each subcircuits contribution in the soft error rate (SER) of the given circuit making it possible to estimate the impacts of changing the structure of the subcircuits on the circuit SER. Hence, it prevents from repeatedly calculating the SER of the circuit that is very time-consuming leading to significant improvements in the optimization runtime. Experimental studies on ISCAS benchmark circuits show that the proposed approach, on average, achieves 18.4% SER reduction with 11.9% area overhead and 8.2% delay overhead comparing to the original circuit while the global SET-based SER mitigation approach and the global MET-based SER mitigation approach achieve 8.46% and 21.8% SER reduction, respectively. Besides, the proposed technique is about $580 \times $ faster than the global MET-based method. [ABSTRACT FROM AUTHOR]

Outsourcing of integrated circuit (IC) fabrication to external foundries has lead to many new security vulnerabilities, including IC piracy, overbuilding, and reverse engineering. In this regard, logic locking (LL) was introduced to protect intellectual property from such threats. In this paper, we evaluate the strength of various LL techniques, including earlier works, such as random LL (RLL) and fault analysis-based LL (FLL), against power-based side-channel attack. We have developed attacks where at least 60% of the key bits can be successfully recovered for 60% of the circuits for both RLL and FLL using a 32-bit key. However, the success rate reduces to 45% and 35% for RLL and FLL, respectively, when using a 64-bit key. We demonstrate the practicality of our proposed attack by mounting it against RLL and FLL implementations of ISCAS’85 and MCNC benchmark circuits on Spartan-6 FPGA platform. Further, we present differential power analysis (DPA) results on mutual information analysis on LL techniques that capture any dependence between the intermediate data and the captured power traces. We also formally establish that resilience to satisfiability-based (SAT) attack implies resilience to DPA attack as well for an LL technique. We validate this further via experiments on Spartan-6 FPGA on SAKURA-G development board for a recent LL technique that is known to thwart the SAT attack. [ABSTRACT FROM AUTHOR]

This paper defines a new type of a low-power broadside test, called a reverse low-power broadside test, whose application requires design-for-testability logic. The unique feature of a reverse low-power broadside test is that it duplicates the switching activity during the second functional capture cycle of a given low-power broadside test, except that signal-transitions are reversed. Thus, the switching activity of a reverse low-power broadside test duplicates that of a low-power broadside test in every subcircuit and on every line individually. In addition, the reversed test detects different faults, and can thus increase the fault coverage of a low-power broadside test set. This paper studies the ability of reverse low-power broadside tests to increase the transition fault coverage in benchmark circuits considering functional broadside tests as well as low-power broadside tests that are not functional. [ABSTRACT FROM AUTHOR]

Functional test sequences can detect defects that are not detected by scan-based tests, but overall, achieve a lower gate-level fault coverage than scan-based tests. Design-for-testability (DFT) approaches for functional test sequences cause the sequences to deviate from functional operation conditions in arbitrary ways over the entire design. This paper introduces the concept of invisible-DFT as a DFT approach for functional test sequences, where the effects of activating the DFT logic are confined to selected logic blocks. This paper develops an invisible-scan approach. Considering a single logic block, the procedure described in this paper inserts scan shift cycles into a functional test sequence while maintaining the same primary input and output sequences for the logic block. This makes the activation of the DFT logic invisible to other logic blocks. The procedure allows a limited number of primary output vectors to be corrected for this purpose. Experimental results are presented to demonstrate the increase in fault coverage that can be achieved by invisible-scan. [ABSTRACT FROM AUTHOR]

Marginal hardware introduces severe reliability threats throughout the life cycle of a system. Although marginalities may not affect the functionality of a circuit immediately after manufacturing, they can degrade into hard failures and must be screened out during manufacturing test to prevent early life failures. Furthermore, their evolution in the field must be proactively monitored by periodic tests before actual failures occur. In recent years, small delay faults (SDFs) have gained increasing attention as possible indicators of marginal hardware. However, SDFs on short paths may be undetectable even with advanced timing aware ATPG. Faster-than-at-speed test (FAST) can detect such hidden delay faults (HDFs), but so far FAST has mainly been restricted to manufacturing test. This paper presents a fully autonomous built-in self-test approach for FAST, which supports in-field testing by appropriate strategies for test generation and response compaction. In particular, the required test frequencies for HDF detection are selected, such that hardware overhead and test time are minimized. Furthermore, test response compaction handles the large number of unknowns (${X}$ -values) on long paths by storing intermediate MISR-signatures in a small on-chip memory for later analysis using ${X}$ -canceling transformations. A comprehensive experimental study demonstrates the effectiveness of the presented approach. In particular, the impact of the considered fault size is studied in detail. [ABSTRACT FROM AUTHOR]

Two challenges are combined when compressed tests are computed for path delay faults: 1) path delay faults that are important to detect are associated with long paths, and many of these faults are undetectable and 2) it may not be possible to compress a given test for a path delay fault. This paper addresses these challenges in the context of test data compression methods that are based on a linear-feedback shift-register (LFSR). The basic approach that this paper uses modifies initially random seeds for the LFSR into seeds that produce tests for detecting target faults. This approach can find seeds even if the available tests cannot be compressed into seeds. In addition, the procedure described in this paper also selects detectable path delay faults to address the presence of undetectable path delay faults in the set of target faults. For this purpose it uses a metric that measures the similarity between target and detected path delay faults, and attempts to compute seeds that increase the values of this metric. Experimental results are presented to demonstrate the ability of the procedure to detect path delay faults in benchmark circuits. [ABSTRACT FROM AUTHOR]

Current nanometer CMOS circuits show an increasing sensitivity to deviations in first-order parameters and suffer from process variations during manufacturing. To properly assess and support test validation of digital designs, low-level fault simulation approaches are utilized to accurately capture the behavior of CMOS cells under parametric faults and process variations as early as possible throughout the design phase. However, low-level simulation approaches exhibit a high computational complexity, especially when variation has to be taken into account. In this paper, a high-throughput parallel fault simulation at switch level is presented. First-order electrical parameters are utilized to capture CMOS-specific functional and timing behavior of complex cells allowing to model faults with transistor granularity and without the need of logic abstraction. Furthermore, variation modeling in cells and transistor devices enables broad and efficient variation analyses of faults over many circuit instances for the first time. The simulation approach utilizes massive parallelization on graphics processing units by exploiting parallelism from cells, stimuli, faults, and circuit instances. Despite the lower abstraction levels of the approach, it processes designs with millions of gates and outperforms conventional fault simulation at logic level in terms of speed and accuracy. [ABSTRACT FROM AUTHOR]

Due to many state-holding elements in asynchronous circuits, many faults need two-pattern tests. This paper presents a test methodology (DR-scan) for dual-rail asynchronous circuits. Our design for testability is a full-scan, clock-less technique that supports both one-pattern and two-pattern tests for single stuck-at faults. DR-scan is able to test memory elements in dual-rail logic without breaking local feedback loops. To reduce test time, we choose a minimum set of selected test configurations (TCs). If there are more than one selected TCs, we need to split scan latches into multiple scan chains. To apply two-pattern tests, we partition the circuit using vertex coloring. With our test methodology, we can apply traditional full-scan automatic test pattern generation (ATPG) to generate two-pattern tests with high test coverage. Experimental results show our methodology can achieve test coverage up to nearly 94% for various asynchronous circuits. [ABSTRACT FROM AUTHOR]

Detecting equivalence classes of injected faults for functional verification of electronic systems is an important task because it helps reducing the number of faults to qualify a verification environment, and hence, improves the performance of qualification process and the validation time required for large-scale electronic systems. This paper describes an efficient way of detecting equivalent injected faults in a mapped netlist in order to speedup the qualification process of a verification environment for functional safety. The presented fault models include general faults resulting in arbitrary functional changes, in addition to conventional stuck-at faults. The solution is based on structural pruning and functional analysis performed by a synergistic combination of iterative Boolean satisfiability and guided simulation. It should be noted that traditional brute-force-like methods would take many hours or even days to identify thousands of equivalent functional faults injected to a small circuit with only hundred of cells. The proposed approach can achieve excellent fault reduction ratios within few seconds for such small circuits. The implementation also scales well for the largest ISCAS’89 and OpenCores benchmarks containing over 35K gates and 490K general functional faults. [ABSTRACT FROM AUTHOR]

Opens are known to be one of the predominant defects in nanoscale technologies. With an increasing number of complex cells in today’s very large-scale integration designs intracell opens are becoming a larger and larger problem. Typically, these defects are modeled by transistor stuck-off faults (TSOFs) and assumed to be detected by transition delay fault (TDF) timing tests. However, tests for TDF fail to detect a high percentage of TSOFs and even tools that target them directly are not sufficient to screen all open defects. Furthermore, generated tests might be invalidated in case hazards and charge-sharing are not properly considered. In this paper, we present a waveform-accurate SAT-based automatic test pattern generation (ATPG) framework to tackle these problems. The proposed method not only allows for the generation of tests that are robust against hazards and charge-sharing, it can also be used to generate tests for faults only detectable by hazard-based activation—and hence even increase the fault coverage beyond state-of-the-art cell-aware tests. Our experimental results for the largest ITC’99, IWLS 2005 as well as larger industrial circuits mapped to the state-of-the-art NanGate 45-nm as well as NanGate 15-nm cell library using complex cells show the high efficiency and scalability of the proposed method. For example, the results show that without properly considering hazards and charge-sharing up to 17.9% of the generated tests could be invalidated. In addition, hazard-activated ATPG allows to detect an additional 10.1% of conventionally undetectable faults that could result in a very significant defective parts per million improvement. [ABSTRACT FROM AUTHOR]

In recent years, a new concurrent error detection method by using invariant relationships inside a circuit, called implications, has been proposed. Algorithms have also been developed to reduce the total number of required implications so as to minimize the incurred area overhead due to implication checking logic. This implication reduction process, however, would result in degradation on the probability of error detection ( P{\mathrm{ detection}} ) of the method. In this paper, we analyze the impact of this issue mathematically together with illustration by a real case study. Our analytical results show that just one percent degradation on P{\mathrm{ detection}} would result in millions more errors being undetected per second and thereby significant loss on reliability of the target circuit. To address this issue, we develop a new implication reduction algorithm that guarantees no loss on P{\mathrm{ detection}} . In our algorithm, the detectability of errors for each candidate implication is carefully evaluated. The evaluation results are then utilized to select the most efficient candidates for detecting all the detectable errors. We also analyze the computation and memory complexity of the proposed algorithm. The experimental results on 28 representative benchmark circuits from ISCAS’85, ISCAS’89, and ITC’99 show that the implication reduction rate of our method (92.59%) is close to that of the previous work (95.8%). Only a small number of additional implications need to be selected to guarantee no loss on P{\mathrm{ detection}} . [ABSTRACT FROM PUBLISHER]

Security-sensitive usage models, such as implantable and wearable medical devices are prone to algorithmic cryptographic attacks as well as malicious implementation attacks. The cryptographic algorithms in these cryptosystems, such as lightweight block ciphers utilized in constrained applications, face significant tradeoff between the high level of security and the efficiency of their implementation metrics. For thwarting fault analysis attacks, among effective variants of active implementation attacks, and also to detect natural faults, efficient fault diagnosis schemes for these lightweight block ciphers are essential. In this paper, for the first time, we propose error detection schemes for lightweight block cipher, KLEIN, to ameliorate its error resiliency with low hardware complexity. The proposed fault diagnosis architectures are for linear and nonlinear components of this cipher. We also consider the notion of fault space transformation for lightweight cryptography and present its potential complications. The implementation of the proposed schemes through variants of Xilinx field-programmable gate arrays and the error coverage assessed with fault injection simulations show the effectiveness of the proposed schemes with acceptable footprints. [ABSTRACT FROM AUTHOR]

Manufacturing defects that do not affect the functional operation of low power integrated circuits (ICs) can nevertheless impact their power saving capability. We show that stuck-ON faults on the power switches and resistive bridges between the power networks can impair the power saving capability of power-gating designs. For quantifying the impact of such faults on the power savings of power-gating designs, we propose a diagnosis technique that targets bridges between the power networks. The proposed technique is based on the static power analysis of a power-gating design in stand-by mode and it utilizes a novel on-chip signature generation unit, which is sensitive to the voltage level between power rails, the measurements of which are processed off-line for the diagnosis of bridges that can adversely affect power savings. We explore, through SPICE simulation of the largest IWLS’05 benchmarks synthesized using a 32 nm CMOS technology, the tradeoffs achieved by the proposed technique between diagnosis accuracy and area cost and we evaluate its robustness against process variation. The proposed technique achieves a diagnosis resolution that is higher than 98.6% and 97.9% for bridges of R~\gtrsim ~10~ M\Omega (weak bridges) and bridges of R~\lesssim~10~ M\Omega (strong bridges), respectively, and a diagnosis accuracy higher than 94.5% for all the examined defects. The area overhead is small and scalable: it is found to be 1.8% and 0.3% for designs with 27 K and 157 K gate equivalents, respectively. [ABSTRACT FROM AUTHOR]

In secure cryptographic primitives, such as block ciphers, the reliability of hardware implementations needs to be closely considered because faults in the hardware implementations can potentially reduce or impact on the underlying security. In this paper, we present approaches to detect errors in hardware implementations of the inversion in GF(28). The proposed approaches are based on both nonredundant and redundant arithmetic, utilizing normal basis (nonredundant) and two redundant Galois field representations, i.e., polynomial ring representation and redundantly represented basis through tower fields. To the best of our knowledge, this is the first work focusing on the error detection architectures for redundant arithmetic-based inversion in GF(28). The presented signature-based schemes in this paper are general and can be applied to block ciphers with 8-bit S-boxes, such as Camellia, SMS4, the advanced encryption standard, and CLEFIA. We present the results of error simulations and application-specific integrated circuit implementations to demonstrate the utility of the presented schemes. Based on the specific implementation’s security/reliability objectives and the overhead/degradation tolerance for implementation/performance metrics, one can fine-tune and tailor the proposed work to achieve more reliable inversions in GF(28). [ABSTRACT FROM PUBLISHER]

Detection and isolation of faults is a crucial step in the physical realization of quantum circuits. Even though quantum gates and circuits compute reversible functions, the standard techniques of automatic test pattern generation (ATPG) for classical reversible circuits are not directly applicable to quantum circuits. For faulty quantum circuits under the widely accepted single fault assumption, we show that their behavior can be fully characterized by the (single) faulty gate and the corresponding fault model. This allows us to efficiently determine test input states as well as measurement strategy for fault detection and diagnosis. Building on top of these, we design randomized algorithms which are able to detect every nontrivial single-gate fault with minimal probability of error. We also describe similar algorithms for fault diagnosis. We evaluate our algorithms by the number of output samples that needs to be collected and the probability of error. Both of these can be related to the eigenvalues of the operators corresponding to the circuit gates. We experimentally compare all our strategies with the state-of-the-art ATPG techniques for quantum circuits under the “single missing faulty gate” model and demonstrate that significant improvement is possible if we can exploit the quantum nature of circuits. [ABSTRACT FROM PUBLISHER]

This paper develops a merging procedure for functional test sequences that achieves test compaction for a pool of functional test sequences by reducing the number of sequences in the pool. The procedure has the following new features: 1) in contrast to existing selection procedures, the merging procedure described in this paper increases the fault coverage of test sequences in the pool, thus enhancing the ability to reduce the number of sequences and 2) in contrast to existing procedures that concatenate or merge test sequences, the procedure described in this paper does not increase the lengths of the sequences it merges. The procedure is based on the concept of restoration of test vectors. In the context of test sequence merging, restoration consists of copying test vectors from a test sequence Tj into a test sequence Ti in order to allow Ti to detect faults that Tj detects. The merging procedure focuses on the removal of one test sequence Tj at a time by restoring test vectors from Tj into other sequences, allowing them to detect the faults that Tj detects. Experimental results for benchmark circuits demonstrate that the procedure reduces the number of sequences in a pool significantly. [ABSTRACT FROM PUBLISHER]

A functional test sequence for a design may not be effective as a manufacturing test for a logic block in the design because it achieves a low gate-level fault coverage. This paper describes a procedure for selecting a clock sequence that increases the gate-level fault coverage of a functional test sequence when it is used for testing a subset of logic blocks. The procedure deactivates the clocks to the logic blocks in the subset when a primary input vector has a negative effect on their fault coverage. The procedure is different from earlier test generation and test compaction procedures in that it increases the fault coverage without modifying the functional test sequence. It thus preserves some of the functional characteristics and the test application process for the sequence. Experimental results for benchmark circuits are presented to demonstrate the effectiveness of the procedure. [ABSTRACT FROM AUTHOR]

Delay fault simulation is an essential task during test pattern generation and reliability assessment of electronic circuits. With the high sensitivity of current nano-scale designs toward even smallest delay deviations, the simulation of small gate delay faults has become extremely important. Since these faults have a subtle impact on the timing behavior, traditional fault simulation approaches based on abstract timing models are not sufficient. Furthermore, the detection of these faults is compromised by the ubiquitous variations in the manufacturing processes, which causes the actual fault coverage to vary from circuit instance to circuit instance, and makes the use of timing accurate methods mandatory. However, the application of timing accurate techniques quickly becomes infeasible for larger designs due to excessive computational requirements. In this paper, we present a method for fast and waveform-accurate simulation of small delay faults on graphics processing units with exceptional computational performance. By exploiting multiple dimensions of parallelism from gates, faults, waveforms, and circuit instances, the proposed approach allows for timing-accurate and exhaustive small delay fault simulation under process variation for designs with millions of gates. [ABSTRACT FROM AUTHOR]

This paper presents Star-EDT—a novel deterministic test compression scheme. The proposed solution seamlessly integrates with EDT-based compression and takes advantage of two key observations: 1) there exist clusters of test vectors that can detect many random-resistant faults with a cluster comprising a parent pattern and its derivatives obtained through simple transformations and 2) a significant majority of specified positions of ATPG-produced test cubes are typically clustered within a single or, at most, a few scan chains. The Star-EDT approach elevates compression ratios to values typically unachievable through conventional reseeding-based solutions. Experimental results obtained for large industrial designs, including those with a new class of test points aware of ATPG-induced conflicts, illustrate feasibility of the proposed deterministic test scheme and are reported herein. In particular, they confirm that the Star-EDT can act as a valuable form of deterministic BIST. [ABSTRACT FROM PUBLISHER]

An approach capable of identifying the locations of distributed small delay defects, arising due to manufacturing aberrations, is proposed. It is shown that the proposed formulation can be transformed into a Boolean satisfiability form to be solved by any satisfiability solver. The approach is capable of providing a small number of alternative sets of potential defective segments, and one of the solutions is the actual defect configuration. This is shown to be a very important property toward the effective identification of the defective segments. Experimental analysis on International symposium on circuits and systems and International Test Conference benchmark suites show that the proposed approach is highly scalable and identifies the location of multiple delay defects. [ABSTRACT FROM AUTHOR]

It was shown earlier that certain primary input values have a negative effect on the fault coverage of a functional test sequence when they appear repeatedly in the sequence. A gate-level sequential test generation procedure based on this observation computed a primary input cube c with preferred values, and generated random functional test sequences that conformed to c with a high probability 0.5 \leq p < 1 . This procedure selected values for p out of a set of possible values, and assigned the same value of p to all the primary inputs. Motivated by the low computational complexity of this procedure, this paper addresses the selection of p and the possibility of using different values of p for different primary inputs. The goal is to increase the fault coverage and reduce the number of functional test sequences. The procedure described in this paper adjusts a functional test sequence to a circuit by complementing values that conflict with c . The procedure requires fewer functional test sequences to reach or exceed the fault coverage of the earlier procedure for benchmark circuits. The procedure can be applied to any functional test sequence or set of functional test sequences. [ABSTRACT FROM AUTHOR]

Test compaction is an important aspect in the post-production test since it is able to reduce the test data and the test costs, respectively. Current automatic test pattern generation (ATPG) methods treat all faults independently from each other which limits the test compaction capability. We propose a new optimization satisfiability (SAT)-based ATPG for compact test set generation with high fault coverage as well as a new retargeting stage for test set reduction. The ATPG is based on a novel multiple-target test generation formulation using optimization techniques. Robust SAT-based solving algorithms are leveraged to determine compatible fault groups which can be detected by the same test. The proposed technique can be used during initial compact test generation as well as a post-process to increase the compactness of existing test sets, e.g., generated by commercial tools, in an iterative manner. Experimental results show that the proposed SAT-based approach is able to produce highly compacted test sets with high fault coverage for stuck-at as well as transition faults. The approach is able to produce lower pattern counts than a commercial ATPG tool. For one industrial circuit, the test set size can even be reduced down to 26% of the size generated by a commercial ATPG tool. [ABSTRACT FROM PUBLISHER]

An automatic test pattern generation approach to detect delay defects in a circuit consisting of current mode threshold logic gates is introduced. Each generated pattern should excite the maximum propagation delay at the fault site. Manufactured weights may vary, and maximum delay is ensured by applying an appropriately generated set of patterns per fault. Experimental results show the efficiency of the proposed methods. [ABSTRACT FROM PUBLISHER]

Test vector omission allows the length of a functional test sequence to be reduced without reducing its fault coverage. When a circuit is embedded in a design, the omission of test vectors from a functional test sequence for the circuit may result in a sequence that does not satisfy the functional constraints imposed by the design. This paper addresses this issue by developing a procedure that restores omitted test vectors in order to satisfy functional constraints. For the discussion in this paper, functional constraints are captured by the switching activity of the sequence before any test vectors are omitted from it. This is referred to as its functional switching activity profile. Experimental results demonstrate that the length of a sequence can be reduced even after restoration of omitted test vectors based on its functional switching activity profile. [ABSTRACT FROM AUTHOR]

Die-to-die interconnects linking multiple functional dies in a modern 3-D or 2.5-D IC by micro-bumps could experience resistance increase after certain time of field operation due to parametric defects or aging. To cope with this reliability threat, we present an “on-line transition-time binning method” that aims to continuously detect excessive transition time occurring at a target die-to-die interconnect. Our method attaches a monitor to the termination end of each target interconnect. Any transition (rising or falling) is converted into a pulse-width first, which is then further compared to a dynamically tunable threshold for a binary pass/fail judgment. By multiple runs of transition-time monitoring while sweeping the threshold incrementally, the “transition-time bin” of each target interconnect can be derived and thereby a timing failure threat can be detected by a monitor center before it actually strikes. [ABSTRACT FROM PUBLISHER]

Unknown (X) values emerge during the design process as well as during system operation and test application. X-sources are for instance black boxes in design models, clock-domain boundaries, analog-to-digital converters, or uncontrolled or uninitialized sequential elements. To compute a test pattern for a given fault, well-defined logic values are required both for fault activation and propagation to observing outputs. In presence of X-values, conventional test generation algorithms, based on structural algorithms, Boolean satisfiability (SAT), or binary decision diagram-based reasoning may fail to generate test patterns or to prove faults untestable. This paper proposes the first efficient stuck-at and transition-delay fault test generation algorithm able to prove testability or untestability of faults in presence of X-values. It overcomes the principal pessimism of conventional algorithms when X-values are considered by mapping the test generation problem to the SAT of quantified Boolean formulas. Experiments on ISCAS benchmarks and larger industrial circuits investigate the increase in fault coverage for conventional deterministic and potential detection requirements for both randomized and clustered X-sources. [ABSTRACT FROM PUBLISHER]

This paper introduces a novel test data compression scheme, which is primarily devised for low-power test applications. It is based on a fundamental observation that in addition to low test cube fill rates, a very few specified bits, necessary to detect a fault, are actually irreplaceable, whereas the remaining ones can be placed in alternative locations (scan cells). The former assignments are used to create residual test cubes and, subsequently, test templates. They control a power-aware decompressor and guide automatic test pattern generation to produce highly compressible test patterns through finding alternative assignments. The proposed approach reduces, in a user-controlled manner, scan shift-in switching rates with minimal hardware modifications. It also elevates compression ratios to values typically unachievable through conventional low-power reseeding-based solutions. Experimental results obtained for large industrial designs illustrate feasibility of the proposed test scheme and are reported herein. [ABSTRACT FROM AUTHOR]

Radiation-induced soft errors have become a key challenge in advanced commercial electronic components and systems. We present the results of a soft error rate (SER) analysis of an embedded processor. Our SER analysis platform accurately models generation, propagation, and masking effects starting from a technology response model derived using TCAD simulations at the device level all the way to application masking. The platform employs a combination of accurate models at the device level, analytical error propagation at gate level, and fault emulation at the architecture/application level to provide the detailed contribution of each component (flip-flops, combinational gates, and SRAMs) to the overall SER. At each stage in the modeling hierarchy, an appropriate level of abstraction is used to propagate the effect of errors to the next higher level. Unlike previous studies which are based on very simple test chips, analyzing the entire processor gives more insight into the relative contributions of combinational and sequential SER. The results of this analysis can assist circuit designers to adopt effective hardening techniques to reduce the overall SER while meeting the required power and performance constraints. [ABSTRACT FROM PUBLISHER]

Nowadays, the security level of secure integrated circuits makes simple attacks less efficient. The combination of invasive approaches and fault attacks can be seen as more and more pertinent to retrieve secrets from integrated circuits. This paper includes a practical methodology and its application. We first describe how to retrieve the physical areas of interest for the attack. Then, we perform a deep fault injection characterization of the area of found. For the former, a methodology based on circuit preparation, scanning electron microscope acquisitions, image registration and processing is given allowing to perform a controlled and localized laser fault attack with a state-of-the-art injection platform. The laser fault injection presented here allows the attacker to perform a “bit-set,” a “bit-reset” or a full register “reset”. Controlling the value stored in a flip-flop is critical for security. To illustrate this methodology, an encryption algorithm is targeted. We see that efficient methods that take advantage of the comparison between faulty and correct cipher texts, such as differential fault analysis or “safe error”, are particularly relevant with the proposed methodology. The overall methodology can efficiently be used to speed up an attack and to improve the test coverage. [ABSTRACT FROM PUBLISHER]

Three-dimensional (3-D) stacking of integrated circuits (ICs) using through-silicon-vias (TSVs) is a promising integration platform for next-generation ICs. Since TSVs are not fully accessible prior to bonding, it is difficult to test the combinational logic between scan flip-flops and TSVs at a prebond stage. In order to increase testability, it has been advocated that wrapper cells (WC) be added at both ends of a TSV. However, a drawback of WC is that they incur area overhead and lead to higher latency and performance degradation on functional paths. Prior work proposed the reuse of scan cells to achieve high testability, thereby reducing the number of WC that need to be inserted; however, practical timing considerations were overlooked and the number of inserted WC was still high. We show that the general problem of minimizing the WC is equivalent to the graph-theoretic minimum clique-partitioning problem, and is therefore NP-hard. We adopt efficient heuristic methods to solve the problem and describe a timing-guided and layout-aware solution. We evaluate the heuristic methods using an exact solution technique based on integer linear programming. We also present design-for-test optimization technique to leverage the reuse-based method during post-bond testing. Results are presented for 3-D-stack implementations of the ITC’99 and the OpenCore benchmark circuits. [ABSTRACT FROM PUBLISHER]

In this paper a simulator of soft errors (SEUs) in the configuration memory of SRAM-based FPGAs is presented. The simulator, named ASSESS, adopts fault models for SEUs affecting the configuration bits controlling both logic and routing resources that have been demonstrated to be much more accurate than classical fault models adopted by academic and industrial fault simulators currently available. The simulator permits the propagation of faulty values to be traced in the circuit, thus allowing the analysis of the faulty circuit not only by observing its output, but also by studying fault activation and error propagation. ASSESS has been applied to several designs, including the miniMIPS microprocessor, chosen as a realistic test case to evaluate the capabilities of the simulator. The ASSESS simulations have been validated comparing their results with a fault injection campaign on circuits from the ITC’99 benchmark, resulting in an average error of only 0.1%. [ABSTRACT FROM PUBLISHER]

SPICE offers an accurate method of simulating defect behavior. However, as demonstrated by recent research, it requires long computation time to simulate defect behavior, when considering process variation. To the best of our knowledge, there is no efficient variation-aware delay fault simulation methodology for resistive opens and resistive bridges. This paper presents a fast and accurate delay fault simulation methodology for these two defects. It is fast because it speeds up delay fault computation time by employing two efficient algorithms. The first algorithm is used to calculate transient gate output voltage, which is a key variable needed to compute delay faults. It employs a three step strategy to accelerate the computation of transient gate output voltage without compromising accuracy. The second algorithm uses bisection method to efficiently compute delay fault behavior of a fault-site. The proposed methodology (PM) has been incorporated in an open-source SPICE (NGSPICE) with BSIM4.7 transistor model. The methodology has been validated by comparing results with HSPICE using industrial designs from IWLS 2005 benchmarks and realistic fault-sites have been extracted from synthesized designs. Simulations are carried out using a 65-nm gate library (for illustration). When compared with HSPICE, results show that the PM is on average up to 52-times faster with \leq4.2\% error in accuracy for resistive open and 39-times faster with \leq5.2\% error in accuracy for resistive bridge defects. [ABSTRACT FROM PUBLISHER]

Functional engineering change order (ECO) is a popular technique for rectifying design errors after synthesis and placement stages. We present a new approach to generating the patch circuits for multierror circuit rectification. In this paper, we propose a two-phase approach of: 1) discovering the functional matches in two circuits followed by 2) determining the final patch circuits from the matches. The ECO engine in this paper discovers functional and structural matches in two circuits by coordinating the SAT-sweeping and the cut-matching algorithms. Then, the patch selection is conducted by the combinational equivalence checking technique and a linear-time selection heuristic. The experimental results on public benchmark and industrial circuits demonstrate that this ECO engine outperforms state-of-the-art interpolation-based engines. [ABSTRACT FROM AUTHOR]

Accurate diagnosis of open defects is key to identifying process problems and achieving fast yield improvement. Current diagnosis methodologies for interconnect full open defects have demonstrated their efficiency, assuming that the defective line voltage is mainly determined by neighboring lines and downstream transistor parasitic capacitances. However, the continuous reduction of oxide thickness with every technology node increases gate leakage current significantly, even for high-k dielectrics. In this context, in nanometer CMOS technologies, the defective line cannot be assumed to be electrically isolated because of the impact of gate leakage currents, which may invalidate diagnosis results provided by present methodologies. In this paper, a new methodology is proposed to diagnose interconnect full open defects under the influence of gate leakage currents in CMOS technologies. To the authors' knowledge, such influence has not been previously considered by any of the existing methodologies. Simulation and experimental results demonstrate the proposal efficiency. [ABSTRACT FROM AUTHOR]